Nyquist AD Converters, Sensor Interfaces, and Robustness
Nyquist AD Converters, Sensor Interfaces, and Robustness Advances in Analog Circuit Design, 2012 / [electronic resource] :
edited by Arthur H.M. van Roermund, Andrea Baschirotto, Michiel Steyaert.
- X, 294 p. online resource.
Part I: Nyquist A/D Converters -- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes -- Dual Residue Pipeline ADC -- Time-Interleaved SAR and Slope Converters -- GS/s AD Conversion for Broadband Multi-Stream Reception -- CMOS Ultra High-Speed Time-Interleaved ADCs -- CMOS ADCs for Optical Communications -- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow -- Energy-Efficient Capacitive Sensor Interfaces -- Interface Circuits for MEMS Microphones -- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments -- Part III: Robustness -- How Can Chips Live Under Radiation? -- TDC and Rad Environments -- Matching and Resolution -- Matching in Polymer and Effect on Circuit Topologies -- Statistical Variability and Reliability in Nano-CMOS Transistors.
This book is based on the presentations during the 21st workshop on Advances in Analog Circuit Design. Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity. This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development. Provides a state-of-the-art reference in analog circuit design, written by experts from industry and academia; Presents material in a tutorial-based format; Includes coverage of Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity.
9781461445876
10.1007/978-1-4614-4587-6 doi
Engineering.
Electronics.
Microelectronics.
Electronic circuits.
Engineering.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
TK7888.4
621.3815
Part I: Nyquist A/D Converters -- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes -- Dual Residue Pipeline ADC -- Time-Interleaved SAR and Slope Converters -- GS/s AD Conversion for Broadband Multi-Stream Reception -- CMOS Ultra High-Speed Time-Interleaved ADCs -- CMOS ADCs for Optical Communications -- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow -- Energy-Efficient Capacitive Sensor Interfaces -- Interface Circuits for MEMS Microphones -- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments -- Part III: Robustness -- How Can Chips Live Under Radiation? -- TDC and Rad Environments -- Matching and Resolution -- Matching in Polymer and Effect on Circuit Topologies -- Statistical Variability and Reliability in Nano-CMOS Transistors.
This book is based on the presentations during the 21st workshop on Advances in Analog Circuit Design. Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity. This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development. Provides a state-of-the-art reference in analog circuit design, written by experts from industry and academia; Presents material in a tutorial-based format; Includes coverage of Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity.
9781461445876
10.1007/978-1-4614-4587-6 doi
Engineering.
Electronics.
Microelectronics.
Electronic circuits.
Engineering.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
TK7888.4
621.3815