Semiconductor material and device characterization /
Schroder, Dieter K.
Semiconductor material and device characterization / Dieter K. Schroder. - 3rd ed. - [Piscataway, NJ] : Hoboken, N.J. : IEEE Press ; Wiley, c2006. - xv, 779 p. : ill. ; 25 cm.
"Wiley-Interscience."
Includes bibliographical references and index.
0471739065 (acidfree paper) 9780471739067
Semiconductors.
Semiconductors--Testing.
621.38152 / SCS
Semiconductor material and device characterization / Dieter K. Schroder. - 3rd ed. - [Piscataway, NJ] : Hoboken, N.J. : IEEE Press ; Wiley, c2006. - xv, 779 p. : ill. ; 25 cm.
"Wiley-Interscience."
Includes bibliographical references and index.
0471739065 (acidfree paper) 9780471739067
Semiconductors.
Semiconductors--Testing.
621.38152 / SCS