Test and diagnosis of analogue, mixed-signal and RF integrated circuits :
Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /
edited by Yichuang Sun.
- London : Institution of Engineering and Technology, c2008.
- xx, 389 pages : illustrations ; 24 cm
- Circuits, devices and systems series ; 19 .
- IET circuits, devices and systems series ; 19. .
Includes bibliographical references and index.
Fault diagnosis of linear and non-linear analogue circuits / Yichuang Sun -- Symbolic function approaches for analogue fault diagnosis / Stefano Manetti and Maria Cristina Piccirilli -- Neural-network-based approaches for analogue circuit fault diagnosis / Yichuang Sun and Yigang He -- Hierarchical/decomposition techniques for large-scale analogue diagnosis / Peter Shepherd -- DFT and BIST techniques for analogue and mixed-signal test / Mona Safi-Harb and Gordon Roberts -- Design-for-testability of analogue filters / Yichuang Sun and Masood-ul Hasan -- Test of A/D converters: from converter characteristics to built-in self-test proposals / Andreas Lechner and Andrew Richardson -- Test of [Sigma Delta] converters / Gildas Leger and Adoracion Rueda -- Phase-locked loop test methodologies: current characterization and production test practices / Martin John Burbidge and Andrew Richardson -- On-chip testing techniques for RF wirless transceiver systems and components / Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar Sanchez-Sinencio -- Tuning and calibration of analogue, mixed-signal and RF circuits / James Moritz and Yichuang Sun.
No further information has been provided for this title.
9780863417450 (pbk.) 0863417450 (pbk.)
Linear integrated circuits--Testing.
Mixed signal circuits--Testing.
Radio frequency integrated circuits--Testing.
Linear integrated circuits / Testing.
Mixed signal circuits / Testing.
Radio frequency integrated circuits / Testing.
621.38150287 / TES
Includes bibliographical references and index.
Fault diagnosis of linear and non-linear analogue circuits / Yichuang Sun -- Symbolic function approaches for analogue fault diagnosis / Stefano Manetti and Maria Cristina Piccirilli -- Neural-network-based approaches for analogue circuit fault diagnosis / Yichuang Sun and Yigang He -- Hierarchical/decomposition techniques for large-scale analogue diagnosis / Peter Shepherd -- DFT and BIST techniques for analogue and mixed-signal test / Mona Safi-Harb and Gordon Roberts -- Design-for-testability of analogue filters / Yichuang Sun and Masood-ul Hasan -- Test of A/D converters: from converter characteristics to built-in self-test proposals / Andreas Lechner and Andrew Richardson -- Test of [Sigma Delta] converters / Gildas Leger and Adoracion Rueda -- Phase-locked loop test methodologies: current characterization and production test practices / Martin John Burbidge and Andrew Richardson -- On-chip testing techniques for RF wirless transceiver systems and components / Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar Sanchez-Sinencio -- Tuning and calibration of analogue, mixed-signal and RF circuits / James Moritz and Yichuang Sun.
No further information has been provided for this title.
9780863417450 (pbk.) 0863417450 (pbk.)
Linear integrated circuits--Testing.
Mixed signal circuits--Testing.
Radio frequency integrated circuits--Testing.
Linear integrated circuits / Testing.
Mixed signal circuits / Testing.
Radio frequency integrated circuits / Testing.
621.38150287 / TES