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Semiconductor material and device characterization /

Schroder, Dieter K.

Semiconductor material and device characterization / Dieter K. Schroder. - 2nd ed. - New York : Wiley, c1998. - xxiv, 760 p. : ill. ; 25 cm.

"A Wiley-Interscience publication."

Includes bibliographical references and index.

0471241393 (cloth : alk. paper)


Semiconductors.
Semiconductors--Testing.

621.38152