Welcome to Central Library, SUST

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science (Record no. 45752)

MARC details
000 -LEADER
fixed length control field 03670nam a22005177a 4500
001 - CONTROL NUMBER
control field sulb-eb0023660
003 - CONTROL NUMBER IDENTIFIER
control field BD-SySUS
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20160413122401.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 121025s2013 gw | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783642273810
-- 978-3-642-27381-0
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-3-642-27381-0
Source of number or code doi
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QC176-176.9
072 #7 - SUBJECT CATEGORY CODE
Subject category code PNFS
Source bicssc
Subject category code SCI077000
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 530.41
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Hofmann, Siegfried.
Relator term author.
245 10 - TITLE STATEMENT
Title Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Medium [electronic resource] :
Remainder of title A User-Oriented Guide /
Statement of responsibility, etc. by Siegfried Hofmann.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture Berlin, Heidelberg :
Name of producer, publisher, distributor, manufacturer Springer Berlin Heidelberg :
-- Imprint: Springer,
Date of production, publication, distribution, manufacture, or copyright notice 2013.
300 ## - PHYSICAL DESCRIPTION
Extent XX, 528 p.
Other physical details online resource.
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier
347 ## - DIGITAL FILE CHARACTERISTICS
File type text file
Encoding format PDF
Source rda
490 1# - SERIES STATEMENT
Series statement Springer Series in Surface Sciences,
International Standard Serial Number 0931-5195 ;
Volume/sequential designation 49
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Outline of the Technique/Brief Description -- Theoretical Background -- Instrumentation -- Practical Surface Analysis with AES -- Data Evaluation/Quantification -- Problem Solving with AES (Examples).
520 ## - SUMMARY, ETC.
Summary, etc. To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.  .
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Physics.
Topical term or geographic name as entry element Solid state physics.
Topical term or geographic name as entry element Spectroscopy.
Topical term or geographic name as entry element Microscopy.
Topical term or geographic name as entry element Materials
General subdivision Surfaces.
Topical term or geographic name as entry element Thin films.
Topical term or geographic name as entry element Physics.
Topical term or geographic name as entry element Solid State Physics.
Topical term or geographic name as entry element Spectroscopy and Microscopy.
Topical term or geographic name as entry element Surfaces and Interfaces, Thin Films.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Printed edition:
International Standard Book Number 9783642273803
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title Springer Series in Surface Sciences,
International Standard Serial Number 0931-5195 ;
Volume number/sequential designation 49
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="http://dx.doi.org/10.1007/978-3-642-27381-0">http://dx.doi.org/10.1007/978-3-642-27381-0</a>
912 ## -
-- ZDB-2-CMS
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Koha item type

No items available.