Design, Analysis and Test of Logic Circuits Under Uncertainty (Record no. 48281)
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000 -LEADER | |
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fixed length control field | 03672nam a22005897a 4500 |
001 - CONTROL NUMBER | |
control field | sulb-eb0026189 |
003 - CONTROL NUMBER IDENTIFIER | |
control field | BD-SySUS |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20160413122617.0 |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
fixed length control field | cr nn 008mamaa |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 120921s2013 ne | s |||| 0|eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9789048196449 |
-- | 978-90-481-9644-9 |
024 7# - OTHER STANDARD IDENTIFIER | |
Standard number or code | 10.1007/978-90-481-9644-9 |
Source of number or code | doi |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER | |
Classification number | TK7888.4 |
072 #7 - SUBJECT CATEGORY CODE | |
Subject category code | TJFC |
Source | bicssc |
Subject category code | TEC008010 |
Source | bisacsh |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 621.3815 |
Edition number | 23 |
100 1# - MAIN ENTRY--PERSONAL NAME | |
Personal name | Krishnaswamy, Smita. |
Relator term | author. |
245 10 - TITLE STATEMENT | |
Title | Design, Analysis and Test of Logic Circuits Under Uncertainty |
Medium | [electronic resource] / |
Statement of responsibility, etc. | by Smita Krishnaswamy, Igor L. Markov, John P. Hayes. |
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
Place of production, publication, distribution, manufacture | Dordrecht : |
Name of producer, publisher, distributor, manufacturer | Springer Netherlands : |
-- | Imprint: Springer, |
Date of production, publication, distribution, manufacture, or copyright notice | 2013. |
300 ## - PHYSICAL DESCRIPTION | |
Extent | XII, 124 p. |
Other physical details | online resource. |
336 ## - CONTENT TYPE | |
Content type term | text |
Content type code | txt |
Source | rdacontent |
337 ## - MEDIA TYPE | |
Media type term | computer |
Media type code | c |
Source | rdamedia |
338 ## - CARRIER TYPE | |
Carrier type term | online resource |
Carrier type code | cr |
Source | rdacarrier |
347 ## - DIGITAL FILE CHARACTERISTICS | |
File type | text file |
Encoding format | |
Source | rda |
490 1# - SERIES STATEMENT | |
Series statement | Lecture Notes in Electrical Engineering, |
International Standard Serial Number | 1876-1100 ; |
Volume/sequential designation | 115 |
505 0# - FORMATTED CONTENTS NOTE | |
Formatted contents note | Introduction -- Probabilistic Transfer Matrices -- Computing with Probabilistic Transfer Matrices -- Testing Logic Circuits for Probabilistic Faults -- Signtaure-based Reliability Analysis -- Design for Robustness -- Summary and Extensions. |
520 ## - SUMMARY, ETC. | |
Summary, etc. | Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits. To improve future semiconductor designs, this book describes methods for analyzing, designing, and testing circuits subject to probabilistic effects. The authors first develop techniques to model inherently probabilistic methods in logic circuits and to test circuits for determining their reliability after they are manufactured. Then, they study error-masking mechanisms intrinsic to digital circuits and show how to leverage them to design more reliable circuits. The book describes techniques for: • Modeling and reasoning about probabilistic behavior in logic circuits, including a matrix-based reliability-analysis framework; • Accurate analysis of soft-error rate (SER) based on functional-simulation, sufficiently scalable for use in gate-level optimizations; • Logic synthesis for greater resilience against soft errors, which improves reliability using moderate overhead in area and performance; • Test-generation and test-compaction methods aimed at probabilistic faults in logic circuits that facilitate accurate and efficient post-manufacture measurement of soft-error susceptibility. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Engineering. |
Topical term or geographic name as entry element | Computer hardware. |
Topical term or geographic name as entry element | Arithmetic and logic units, Computer. |
Topical term or geographic name as entry element | Logic design. |
Topical term or geographic name as entry element | Computer software |
General subdivision | Reusability. |
Topical term or geographic name as entry element | Computer science |
General subdivision | Mathematics. |
Topical term or geographic name as entry element | Electronic circuits. |
Topical term or geographic name as entry element | Engineering. |
Topical term or geographic name as entry element | Circuits and Systems. |
Topical term or geographic name as entry element | Arithmetic and Logic Structures. |
Topical term or geographic name as entry element | Computer Hardware. |
Topical term or geographic name as entry element | Performance and Reliability. |
Topical term or geographic name as entry element | Logic Design. |
Topical term or geographic name as entry element | Symbolic and Algebraic Manipulation. |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Markov, Igor L. |
Relator term | author. |
Personal name | Hayes, John P. |
Relator term | author. |
710 2# - ADDED ENTRY--CORPORATE NAME | |
Corporate name or jurisdiction name as entry element | SpringerLink (Online service) |
773 0# - HOST ITEM ENTRY | |
Title | Springer eBooks |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
Relationship information | Printed edition: |
International Standard Book Number | 9789048196432 |
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE | |
Uniform title | Lecture Notes in Electrical Engineering, |
International Standard Serial Number | 1876-1100 ; |
Volume number/sequential designation | 115 |
856 40 - ELECTRONIC LOCATION AND ACCESS | |
Uniform Resource Identifier | <a href="http://dx.doi.org/10.1007/978-90-481-9644-9">http://dx.doi.org/10.1007/978-90-481-9644-9</a> |
912 ## - | |
-- | ZDB-2-ENG |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Source of classification or shelving scheme | |
Koha item type |
No items available.