Electrical overstress (EOS) : (Record no. 64362)
[ view plain ]
| 000 -LEADER | |
|---|---|
| fixed length control field | 05765cam a2200877 i 4500 |
| 001 - CONTROL NUMBER | |
| control field | sulb-eb0032710 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | BD-SySUS |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20170713221340.0 |
| 006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS | |
| fixed length control field | m o d |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
| fixed length control field | cr ||||||||||| |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 130627s2013 enk ob 001 0 eng |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER | |
| LC control number | 2013026202 |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | DLC |
| Language of cataloging | eng |
| Description conventions | rda |
| Transcribing agency | DLC |
| Modifying agency | YDX |
| -- | N$T |
| -- | IDEBK |
| -- | CDX |
| -- | CUS |
| -- | COO |
| -- | YDXCP |
| -- | OCLCF |
| -- | E7B |
| -- | OTZ |
| -- | EBLCP |
| -- | DEBBG |
| -- | BD-SySUS |
| 019 ## - | |
| -- | 876848086 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781118703335 (ePub) |
| International Standard Book Number | 1118703332 (ePub) |
| International Standard Book Number | 9781118703342 (Adobe PDF) |
| International Standard Book Number | 1118703340 (Adobe PDF) |
| Canceled/invalid ISBN | 9781118511886 (hardback) |
| International Standard Book Number | 9781118703328 |
| International Standard Book Number | 1118703324 |
| International Standard Book Number | 9781299831124 (MyiLibrary) |
| International Standard Book Number | 1299831125 (MyiLibrary) |
| International Standard Book Number | 1118511883 (hdbk.) |
| International Standard Book Number | 9781118511886 (hdbk.) |
| 029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC) | |
| OCLC library identifier | AU@ |
| System control number | 000051686184 |
| OCLC library identifier | NZ1 |
| System control number | 15228751 |
| OCLC library identifier | DEBBG |
| System control number | BV041634390 |
| OCLC library identifier | CHVBK |
| System control number | 314703136 |
| OCLC library identifier | CHBIS |
| System control number | 010131675 |
| OCLC library identifier | DKDLA |
| System control number | 820120-katalog:000667531 |
| OCLC library identifier | DEBBG |
| System control number | BV041911377 |
| OCLC library identifier | DEBBG |
| System control number | BV042989359 |
| OCLC library identifier | DEBBG |
| System control number | BV043396053 |
| 035 ## - SYSTEM CONTROL NUMBER | |
| System control number | (OCoLC)851285730 |
| Canceled/invalid control number | (OCoLC)876848086 |
| 042 ## - AUTHENTICATION CODE | |
| Authentication code | pcc |
| 050 00 - LIBRARY OF CONGRESS CALL NUMBER | |
| Classification number | TK7871.852 |
| 072 #7 - SUBJECT CATEGORY CODE | |
| Subject category code | TEC |
| Subject category code subdivision | 009070 |
| Source | bisacsh |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.3815 |
| Edition number | 23 |
| 084 ## - OTHER CLASSIFICATION NUMBER | |
| Classification number | TEC008010 |
| Number source | bisacsh |
| 049 ## - LOCAL HOLDINGS (OCLC) | |
| Holding library | MAIN |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Voldman, Steven H. |
| 245 10 - TITLE STATEMENT | |
| Title | Electrical overstress (EOS) : |
| Remainder of title | devices, circuits, and systems / |
| Statement of responsibility, etc. | Steven Voldman. |
| 264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
| Place of production, publication, distribution, manufacture | Chichester, West Sussex, United Kingdom : |
| Name of producer, publisher, distributor, manufacturer | John Wiley & Sons Inc., |
| Date of production, publication, distribution, manufacture, or copyright notice | 2013. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 1 online resource. |
| 336 ## - CONTENT TYPE | |
| Content type term | text |
| Source | rdacontent |
| 337 ## - MEDIA TYPE | |
| Media type term | computer |
| Source | rdamedia |
| 338 ## - CARRIER TYPE | |
| Carrier type term | online resource |
| Source | rdacarrier |
| 490 1# - SERIES STATEMENT | |
| Series statement | ESD series |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc. | "Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design. It provides an illuminating insight into the sources of EOS in manufacturing, integration of on-chip, and system level EOS protection networks, followed by examples in specific technologies, circuits, and chips. The book is unique in covering the EOS manufacturing issues from on-chip design and electronic design automation to factory-level EOS program management in today's modern world.Look inside for extensive coverage on: Fundamentals of electrical overstress, from EOS physics, EOS time scales, safe operating area (SOA), to physical models for EOS phenomena EOS sources in today's semiconductor manufacturing environment, and EOS program management, handling and EOS auditing processing to avoid EOS failures EOS failures in both semiconductor devices, circuits and system Discussion of how to distinguish between EOS events, and electrostatic discharge (ESD) events (e.g. such as human body model (HBM), charged device model (CDM), cable discharge events (CDM), charged board events (CBE), to system level IEC 61000-4-2 test events) EOS protection on-chip design practices and how they differ from ESD protection networks and solutions Discussion of EOS system level concerns in printed circuit boards (PCB), and manufacturing equipment Examples of EOS issues in state-of-the-art digital, analog and power technologies including CMOS, LDMOS, and BCD EOS design rule checking (DRC), LVS, and ERC electronic design automation (EDA) and how it is distinct from ESD EDA systems EOS testing and qualification techniques, and Practical off-chip ESD protection and system level solutions to provide more robust systems Electrical Overstress (EOS): Devices, Circuits and Systems is a continuation of the author's series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the nano-electronic era"-- |
| Assigning source | Provided by publisher. |
| Summary, etc. | "This book addresses EOS phenomena and distinguish it from other forms of phenomena such as electrostatic discharge (ESD), latchup, and EMC events"-- |
| Assigning source | Provided by publisher. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc | Includes bibliographical references and index. |
| 588 ## - SOURCE OF DESCRIPTION NOTE | |
| Source of description note | Description based on print version record and CIP data provided by publisher. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Semiconductors |
| General subdivision | Failures. |
| Topical term or geographic name as entry element | Semiconductors |
| General subdivision | Protection. |
| Topical term or geographic name as entry element | Transients (Electricity) |
| Topical term or geographic name as entry element | Overvoltage. |
| Topical term or geographic name as entry element | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General. |
| Source of heading or term | bisacsh |
| Topical term or geographic name as entry element | Overvoltage. |
| Source of heading or term | fast |
| Authority record control number | (OCoLC)fst01049455 |
| Topical term or geographic name as entry element | Semiconductors |
| General subdivision | Failures. |
| Source of heading or term | fast |
| Authority record control number | (OCoLC)fst01112222 |
| Topical term or geographic name as entry element | Semiconductors |
| General subdivision | Protection. |
| Source of heading or term | fast |
| Authority record control number | (OCoLC)fst01112246 |
| Topical term or geographic name as entry element | Transients (Electricity) |
| Source of heading or term | fast |
| Authority record control number | (OCoLC)fst01154691 |
| 655 #4 - INDEX TERM--GENRE/FORM | |
| Genre/form data or focus term | Electronic books. |
| Genre/form data or focus term | Electronic books. |
| Source of term | local |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
| Relationship information | Print version: |
| Main entry heading | Voldman, Steven H. |
| Title | Electrical overstress (EOS) |
| Place, publisher, and date of publication | Chichester, West Sussex, United Kingdom : John Wiley & Sons Inc., 2013 |
| International Standard Book Number | 9781118511886 |
| Record control number | (DLC) 2013022183 |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE | |
| Uniform title | ESD series. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118703328">http://onlinelibrary.wiley.com/book/10.1002/9781118703328</a> |
| Public note | Wiley Online Library [Free Download only for SUST IP] |
| 938 ## - | |
| -- | EBSCOhost |
| -- | EBSC |
| -- | 636376 |
| -- | Ingram Digital eBook Collection |
| -- | IDEB |
| -- | cis26098993 |
| -- | Coutts Information Services |
| -- | COUT |
| -- | 26098993 |
| -- | YBP Library Services |
| -- | YANK |
| -- | 11117873 |
| -- | ebrary |
| -- | EBRY |
| -- | ebr10753372 |
| -- | YBP Library Services |
| -- | YANK |
| -- | 10350695 |
| -- | EBL - Ebook Library |
| -- | EBLB |
| -- | EBL4037894 |
| 994 ## - | |
| -- | 92 |
| -- | DG1 |
No items available.