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Linear and nonlinear models for the analysis of repeated measurements / Edward F. Vonesh, Vernun M. Chinchilli.
Material type:
TextSeries: Statistics, textbooks and monographs ; v. 154Publication details: New York : M. Dekker, c1997.Description: xii, 560 p. : ill. ; 24 cm. + 1 computer disk (3 1/2 in.)ISBN: - 0824782488 (alk. paper)
- 519.535 22
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode |
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Central Library, SUST General Stacks | 519.535 VOL (Browse shelf(Opens below)) | 1 | Available | 0052578 | |
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Central Library, SUST General Stacks | 519.535 VOL (Browse shelf(Opens below)) | 2 | Available | 0052820 |
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| 519.5350 STA Applied multivariate statistics for the social sciences / | 519.535 TOP Topics in applied multivariate analysis / | 519.535 VOL Linear and nonlinear models for the analysis of repeated measurements / | 519.535 VOL Linear and nonlinear models for the analysis of repeated measurements / | 519.5352 COA Analysis of binary data / | 519.5352 DUA Applied statistics : | 519.53520 WOB Basic analysis of variance programs for microcomputers / |
System requirements for accompanying computer disk: Program written using SAS, tested on IBM PS/2; may run on any PC or mainframe under DOS, Windows, or OS/2 with access to SAS.
Includes bibliographical references (p. 523-546) and indexes.
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