Welcome to Central Library, SUST
Amazon cover image
Image from Amazon.com
Image from Google Jackets

Statistical analysis of reliability and life-testing models : theory and methods / Lee J. Bain, Max Engelhardt.

By: Contributor(s): Material type: TextTextPublication details: New York : M. Dekker, c1991.Edition: 2nd edDescription: vii, 496 p. : ill. ; 24 cmISBN:
  • 0824785061
Subject(s): DDC classification:
  • 620.00452 22
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)

Includes bibliographical references (p. 479-491) and index.

There are no comments on this title.

to post a comment.