TY  - BOOK
AU  - Goel,Sandeep K
AU  - Chakrabarty,Krishnendu
TI  - Testing for small-delay defects in nanoscale CMOS integrated circuits
T2  - Devices, circuits, and systems
SN  - 9781439829424 (ebook : PDF)
KW  - Metal oxide semiconductors, Complementary
KW  - Testing
N1  - Includes bibliographical references and index
UR  - http://marc.crcnetbase.com/isbn/9781439829424
ER  -