TY  - BOOK
AU  - Bhushan,Bharat
ED  - SpringerLink (Online service)
TI  - Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
T2  - NanoScience and Technology,
SN  - 9783642254147
AV  - QC176.8.N35 
U1  - 620.5 23
PY  - 2013///
CY  - Berlin, Heidelberg
PB  - Springer Berlin Heidelberg, Imprint: Springer
KW  - Physics
KW  - Nanoscale science
KW  - Nanoscience
KW  - Nanostructures
KW  - Nanotechnology
KW  - Biomedical engineering
KW  - Biomaterials
KW  - Materials science
KW  - Nanoscale Science and Technology
KW  - Nanotechnology and Microengineering
KW  - Biomedical Engineering
KW  - Characterization and Evaluation of Materials
N1  - Part 1: Scanning probe microscopy techniques- Spectroscopic techniques in SPM- High speed AFM imaging -- New developments in imaging of biological samples -- New developments in AFM -- SNOM -- Part 2: Nanocharacterization -- Antibodies for protein recognition -- In-situ imaging of living cells -- In-situ crystallization of wax materials -- Part 3: Biomimetics and industrial applications -- Electrowetting and switchable hydrophobicity -- Renewable energy applications -- AFMs in hard disk industry
N2  - This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective
UR  - http://dx.doi.org/10.1007/978-3-642-25414-7
ER  -