TY  - BOOK
AU  - Chikawa,J.
AU  - Sumino,K.
AU  - Wada,K.
TI  - Defects and properties of semiconductors: defect engineering 
SN  - 9027723524 (D. Reidel)
U1  - 621.38152 22
PY  - 1987///
CY  - Tokyo
PB  - KTK Scientific
KW  - Semiconductors
KW  - Defects
KW  - Congresses
N1  - Includes bibliographies and index
ER  -