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1.
Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach / edited by Yichuang Sun. by
  • Sun, Yichuang
  • Institution of Engineering and Technology
Series: IET circuits, devices and systems series ; 19.
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: London : Institution of Engineering and Technology, c2008
Online access:
Availability: Items available for loan: Central Library, SUST (2)Call number: 621.38150287 TES, ...

2.
Control & automation [electronic resource]. by
  • Institution of Engineering and Technology [issuing body.]
Source: Academic Search Premier
Material type: Continuing resource Continuing resource; Format: available online remote; Type of continuing resource: periodical
Publication details: Stevenage, UK : Michael Faraday House, �2007-
Other title:
  • IET control & automation
  • Control and automation
Availability: No items available.

3.
Power engineer [electronic resource]. by
  • Institution of Electrical Engineers
  • Institution of Engineering and Technology
Source: Academic Search Premier
Material type: Continuing resource Continuing resource; Format: available online remote; Type of continuing resource: periodical
Publication details: Stevenage, U.K. : Institution of Electrical Engineers, c2003-
Other title:
  • IEE power engineer
  • IET power engineer
Availability: No items available.

4.
Computing & control engineering journal [electronic resource]. by
  • Institution of Electrical Engineers
  • Institution of Engineering and Technology
Source: Academic Search Premier
Material type: Continuing resource Continuing resource; Format: available online remote; Type of continuing resource: periodical
Publication details: London : Institution of Electrical Engineers
Other title:
  • Computing and control engineering journal
  • IEE computing & control engineering
  • Computing & control engineering
  • IET computing & control engineering
Availability: No items available.

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