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Statistical analysis of reliability and life-testing models : theory and methods / Lee J. Bain, Max Engelhardt.

By: Contributor(s): Material type: TextTextPublication details: New York : M. Dekker, c1991.Edition: 2nd edDescription: vii, 496 p. : ill. ; 24 cmISBN:
  • 0824785061
Subject(s): DDC classification:
  • 620.00452 22
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Holdings
Item type Current library Call number Copy number Status Date due Barcode
Books Books Central Library, SUST General Stacks 620.00452 BAS (Browse shelf(Opens below)) 1 Available 0026244
Books Books Central Library, SUST General Stacks 620.00452 BAS (Browse shelf(Opens below)) 2 Available 0026245

Includes bibliographical references (p. 479-491) and index.

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