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	1.	ELECTROMIGRATION IN ULSI INTERCONNECTIONS / by TAN CHER MING Material type: Text; Format: print ; Literary form: Not fiction Online access: Click here to access online Availability: No items available. Add to cart (remove)
	2.	Electromigration Modeling at Circuit Layout Level [electronic resource] / by Cher Ming Tan, Feifei He. by Tan, Cher Ming [author.] He, Feifei [author.] SpringerLink (Online service) Series: SpringerBriefs in Applied Sciences and Technology Source: Springer eBooks Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: Singapore : Springer Singapore : Imprint: Springer, 2013 Online access: Click here to access online Availability: No items available. Add to cart (remove)

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