Applied logistic regression. by
- Hosmer, David W
- Lemeshow, Stanley
- Sturdivant, Rodney X
Series: Wiley series in probability and statistics
Edition: Third edition / David W. Hosmer, Jr., PhD, Stanley Lemeshow, PhD, Rodney X. Sturdivant, PhD.
Material type: Text; Format:
available online
; Literary form:
Not fiction
Publisher: Hoboken, New Jersey : Wiley, [2013]
Availability: Items available for loan: Central Library, SUST (1)Call number: 519.5 HOA.