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1.
Testing for small-delay defects in nanoscale CMOS integrated circuits / edited by Sandeep K. Goel, Krishnendu Chakrabarty. by
  • Goel, Sandeep K [editor of compilation.]
  • Chakrabarty, Krishnendu [editor of compilation.]
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Material type: Text Text; Literary form: Not fiction
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2.
Testing for small-delay defects in nanoscale CMOS integrated circuits / edited by Sandeep K. Goel, Krishnendu Chakrabarty. by
  • Goel, Sandeep K [editor of compilation.]
  • Chakrabarty, Krishnendu [editor of compilation.]
Series:
Material type: Text Text; Literary form: Not fiction
Online access:
Availability: No items available.

Add to cart
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