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Statistical regression with measurement error / Chi-Lun Cheng and John W. Van Ness.

By: Contributor(s): Material type: TextTextSeries: Kendall's library of statistics ; 6Publication details: London : Arnold , 1999.Description: xiv, 262 p. : ill. ; 24 cmISBN:
  • 0340614617
Subject(s): DDC classification:
  • 519.536 22
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Holdings
Item type Current library Call number Copy number Status Date due Barcode
Books Books Central Library, SUST General Stacks 519.536 CHS (Browse shelf(Opens below)) 1 Available 0035281
Books Books Central Library, SUST General Stacks 519.536 CHS (Browse shelf(Opens below)) 2 Available 0035280

Includes bibliographical references (p. [241]-252) and indexes.

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