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Design, Analysis and Test of Logic Circuits Under Uncertainty [electronic resource] / by Smita Krishnaswamy, Igor L. Markov, John P. Hayes. by
  • Krishnaswamy, Smita [author.]
  • Markov, Igor L [author.]
  • Hayes, John P [author.]
  • SpringerLink (Online service)
Series: Lecture Notes in Electrical Engineering ; 115
Source: Springer eBooks
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publisher: Dordrecht : Springer Netherlands : Imprint: Springer, 2013
Availability: No items available.