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1.
Quantile-Based Reliability Analysis [electronic resource] / by N. Unnikrishnan Nair, P.G. Sankaran, N. Balakrishnan. by
  • Nair, N. Unnikrishnan [author.]
  • Sankaran, P.G [author.]
  • Balakrishnan, N [author.]
  • SpringerLink (Online service)
Series: Statistics for Industry and Technology
Source: Springer eBooks
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publisher: New York, NY : Springer New York : Imprint: Birkhäuser, 2013
Availability: No items available.

2.
Bounded Noises in Physics, Biology, and Engineering [electronic resource] / edited by Alberto d'Onofrio. by
  • d'Onofrio, Alberto [editor.]
  • SpringerLink (Online service)
Series: Modeling and Simulation in Science, Engineering and Technology
Source: Springer eBooks
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publisher: New York, NY : Springer New York : Imprint: Birkhäuser, 2013
Availability: No items available.

3.
Finance with Monte Carlo [electronic resource] / by Ronald W. Shonkwiler. by
  • Shonkwiler, Ronald W [author.]
  • SpringerLink (Online service)
Series: Springer Undergraduate Texts in Mathematics and Technology
Source: Springer eBooks
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publisher: New York, NY : Springer New York : Imprint: Springer, 2013
Availability: No items available.

4.
Knowledge Spaces [electronic resource] : Applications in Education / edited by Jean-Claude Falmagne, Dietrich Albert, Christopher Doble, David Eppstein, Xiangen Hu. by
  • Falmagne, Jean-Claude [editor.]
  • Albert, Dietrich [editor.]
  • Doble, Christopher [editor.]
  • Eppstein, David [editor.]
  • Hu, Xiangen [editor.]
  • SpringerLink (Online service)
Source: Springer eBooks
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013
Availability: No items available.

5.
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