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SDL 2013: Model-Driven Dependability Engineering [electronic resource] : 16th International SDL Forum, Montreal, Canada, June 26-28, 2013. Proceedings / edited by Ferhat Khendek, Maria Toeroe, Abdelouahed Gherbi, Rick Reed.

Contributor(s): Material type: TextTextSeries: Lecture Notes in Computer Science ; 7916Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013Description: XII, 291 p. 138 illus. online resourceContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9783642389115
Subject(s): Additional physical formats: Printed edition:: No titleDDC classification:
  • 004.6 23
LOC classification:
  • QA76.9.C643
  • TK5105.5-5105.9
Online resources:
Contents:
Verification and testing -- Dependability engineering -- Analysis -- Domain specific languages -- Model transformation -- Specification and description language.- Evolution.
In: Springer eBooksSummary: This book constitutes the refereed proceedings of the 16th System Design Languages Forum, SDL 2013, held in Montreal, QC, Canada, in June 2013. The 16 revised, high-quality, full papers presented were carefully reviewed and selected from 30 submissions. The papers are organized in topical sections on verification and testing; dependability engineering; analysis; domain specific languages; model transformation; specification and description language and evolution.
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Verification and testing -- Dependability engineering -- Analysis -- Domain specific languages -- Model transformation -- Specification and description language.- Evolution.

This book constitutes the refereed proceedings of the 16th System Design Languages Forum, SDL 2013, held in Montreal, QC, Canada, in June 2013. The 16 revised, high-quality, full papers presented were carefully reviewed and selected from 30 submissions. The papers are organized in topical sections on verification and testing; dependability engineering; analysis; domain specific languages; model transformation; specification and description language and evolution.

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