| 000 | 01089nam a2200229 a 4500 | ||
|---|---|---|---|
| 001 | sulb52820 | ||
| 008 | 130218s1997 nyua b 001 0 eng d | ||
| 020 | _a0824782488 (alk. paper) | ||
| 040 |
_aDLC _cDLC _dDLC _dBD-SySUS |
||
| 082 | 0 | 0 |
_a519.535 _222 |
| 100 | 1 |
_aVonesh, Edward F., _d1952- |
|
| 245 | 1 | 0 |
_aLinear and nonlinear models for the analysis of repeated measurements / _cEdward F. Vonesh, Vernun M. Chinchilli. |
| 260 |
_aNew York : _bM. Dekker, _cc1997. |
||
| 300 |
_axii, 560 p. : _bill. ; _c24 cm. + _e1 computer disk (3 1/2 in.) |
||
| 440 | 0 |
_aStatistics, textbooks and monographs ; _vv. 154 |
|
| 538 | _aSystem requirements for accompanying computer disk: Program written using SAS, tested on IBM PS/2; may run on any PC or mainframe under DOS, Windows, or OS/2 with access to SAS. | ||
| 504 | _aIncludes bibliographical references (p. 523-546) and indexes. | ||
| 650 | 0 | _aMultivariate analysis. | |
| 650 | 0 | _aExperimental design. | |
| 700 | 1 |
_aChinchilli, Vernon M., _d1952- |
|
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0647/96041105-d.html |
| 999 |
_c1680 _d1680 |
||