000 | 00819pam a2200181 a 4500 | ||
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001 | sulb-eb0003873 | ||
008 | 150323s2014 fluad ob 001 0 eng d | ||
020 | _a9781439829424 (e-book : PDF) | ||
040 |
_aFlBoTFG _cFlBoTFG _dBD-SySUS |
||
245 | 0 | 0 |
_aTesting for small-delay defects in nanoscale CMOS integrated circuits / _cedited by Sandeep K. Goel, Krishnendu Chakrabarty. |
300 |
_a1 online resource : _btext file, PDF |
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490 | 1 | _aDevices, circuits, and systems | |
504 | _aIncludes bibliographical references and index. | ||
650 | 0 |
_aMetal oxide semiconductors, Complementary _xTesting. |
|
700 | 1 |
_aGoel, Sandeep K, _eeditor of compilation. |
|
700 | 1 |
_aChakrabarty, Krishnendu, _eeditor of compilation. |
|
856 | 4 | 0 |
_uhttp://marc.crcnetbase.com/isbn/9781439829424 _qapplication/PDF _zRead Online / DOWNLOAD. |
999 |
_c24214 _d24214 |