| 000 | 00818pam a2200181 a 4500 | ||
|---|---|---|---|
| 001 | sulb-eb0003920 | ||
| 008 | 150323s2014 fluad ob 001 0 eng d | ||
| 020 | _a9781439829424 (ebook : PDF) | ||
| 040 |
_aFlBoTFG _cFlBoTFG _dBD-SySUS |
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| 245 | 0 | 0 |
_aTesting for small-delay defects in nanoscale CMOS integrated circuits / _cedited by Sandeep K. Goel, Krishnendu Chakrabarty. |
| 300 |
_a1 online resource : _btext file, PDF |
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| 490 | 1 | _aDevices, circuits, and systems | |
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aMetal oxide semiconductors, Complementary _xTesting. |
|
| 700 | 1 |
_aGoel, Sandeep K, _eeditor of compilation. |
|
| 700 | 1 |
_aChakrabarty, Krishnendu, _eeditor of compilation. |
|
| 856 | 4 | 0 |
_uhttp://marc.crcnetbase.com/isbn/9781439829424 _qapplication/PDF _zRead Online / DOWNLOAD. |
| 999 |
_c24261 _d24261 |
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