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001 sulb-eb0004072
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020 _a9789814277112
100 1 _aJOHNSTON ALLAN H.
245 _aRELIABILITY AND RADIATION EFFECTS IN COMPOUND SEMICONDUCTORS /
650 0 _aCIRCUITS & SYSTEMS
856 4 0 _uhttp://www.worldscientific.com/worldscibooks/10.1142/7331#t=toc
999 _c36513
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