000			03714nam a22005177a 4500
001			sulb-eb0021810
003			BD-SySUS
005			20160413122202.0
007			cr nn 008mamaa
008			121009s2013 xxu| s |||| 0|eng d
020			_a9781461422693 _9978-1-4614-2269-3
024	7		_a10.1007/978-1-4614-2269-3 _2doi
050		4	_aTK7888.4
072		7	_aTJFC _2bicssc
072		7	_aTEC008010 _2bisacsh
082	0	4	_a621.3815 _223
100	1		_aMcConaghy, Trent. _eauthor.
245	1	0	_aVariation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide _h[electronic resource] : _bA Hands-on Field Guide / _cby Trent McConaghy, Kristopher Breen, Jeffrey Dyck, Amit Gupta.
264		1	_aNew York, NY : _bSpringer New York : _bImprint: Springer, _c2013.
300			_aXVI, 188 p. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
505	0		_aIntroduction -- Fast PTV Verification and Design -- Pictoral Primer on Probablilities -- 3-Sigma Verification and Design -- High-Sigma Verification and Design -- Variation-Aware Design -- Conclusion.
520			_aThis book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects.  The authors have created a field guide to show how to handle variation proactively, and to understand the benefits of doing so. Readers facing variation challenges in their memory, standard cell, analog/RF, and custom digital designs will find easy-to-read, pragmatic solutions.   Reviews the most important concepts in variation-aware design, including types of variables and variation, useful variation-aware design terminology, and an overview and comparison of high-level design flows. Describes and compares a suite of approaches and flows for PVT corner-driven design and verification. Presents Fast PVT, a novel, confidence-driven global optimization technique for PVT corner extraction and verification that is both rapid and reliable. Presents a visually-oriented overview of probability density functions, Monte Carlo sampling, and yield estimation. Describes a suite of methods used for 2-3 sigma statistical design and presents a novel sigma-driven corners flow, which is a fast, accurate, and scalable method suitable for 2-3 sigma design and verification. Describes and compares high-sigma design and verification techniques and presents a novel technique for high-sigma statistical corner extraction and verification, demonstrating its fast, accurate, scalable, and verifiable qualities across a variety of applications. Compares manual design and automated sizing and introduces an integrated approach to aid the sizing step in PVT, 3σ statistical and high-sigma statistical design.
650		0	_aEngineering.
650		0	_aNanotechnology.
650		0	_aElectronics.
650		0	_aMicroelectronics.
650		0	_aElectronic circuits.
650	1	4	_aEngineering.
650	2	4	_aCircuits and Systems.
650	2	4	_aElectronics and Microelectronics, Instrumentation.
650	2	4	_aNanotechnology and Microengineering.
700	1		_aBreen, Kristopher. _eauthor.
700	1		_aDyck, Jeffrey. _eauthor.
700	1		_aGupta, Amit. _eauthor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781461422686
856	4	0	_uhttp://dx.doi.org/10.1007/978-1-4614-2269-3
912			_aZDB-2-ENG
942			_2Dewey Decimal Classification _ceBooks
999			_c43902 _d43902