000 05759nam a22006137a 4500
001 sulb-eb0023461
003 BD-SySUS
005 20160413122352.0
007 cr nn 008mamaa
008 140104s2013 gw | s |||| 0|eng d
020 _a9783319028743
_9978-3-319-02874-3
024 7 _a10.1007/978-3-319-02874-3
_2doi
050 4 _aT174.7
050 4 _aTA418.9.N35
072 7 _aTBN
_2bicssc
072 7 _aTEC027000
_2bisacsh
072 7 _aSCI050000
_2bisacsh
082 0 4 _a620.115
_223
245 1 0 _aFIB Nanostructures
_h[electronic resource] /
_cedited by Zhiming M. Wang.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2013.
300 _aXIII, 530 p. 375 illus., 200 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aLecture Notes in Nanoscale Science and Technology,
_x2195-2159 ;
_v20
505 0 _aPreface -- Chapter 1: Focused Ion Beam (FIB) technology for micro and nanoscale fabrications -- Chapter 2: Epitaxial ferroelectric nanostructures fabricated by FIB milling -- Chapter 3: Low current focused-ion-beam milling for freestanding nanomaterial characterization -- Chapter 4: Focused ion beam milling of carbon nanotube yarns and Bucky-papers: Correlating their internal structure with their macro-properties -- Chapter 5: Nanoscale electrical contacts grown by Focused-Ion-Beam (FIB) Induced Deposition -- Chapter 6: Metal induced crystallization of focused ion beam induced deposition for functional patterned ultrathin nanocarbon -- Chapter 7: Deterministic Fabrication of Micro- and Nano-Structures by Focused Ion Beam -- Chapter 8: Application of ion beam processes to scanning probe microscopy -- Chapter 9: Fabrication of needle-shaped specimens containing sub-surface nanostructures for Electron Tomography -- Chapter 10: Fabrication technique of deformation carriers (gratings and speckle patterns) with FIB for micro/nano-scale deformation measurement -- Chapter 11: Controlled Quantum Dot Formation on Focused Ion Beam patterned GaAs Substrates -- Chapter 12: Development of Functional Metallic Glassy Materials by FIB and Nano-imprint Technologies -- Chapter 13: Nanostructured Materials Driven by Dielectrophoresis on Nanoelectrods Patterned by Focused Ion Beam -- Chapter 14: Focused Ion Beam Assisted Nano-Scale Processing and Thermoelectrical Characterization -- Chapter 15: FIB design for Nanofluidic applications -- Chapter 16: FIB Patterning of Stainless Steel for the Development of Nano-Structured Stent Surfaces for Cardiovascular Applications -- Chapter 17: Evaluation of damages induced by Ga+ focused ion beam in piezoelectric nanostructures -- Chapter 18: Instabilities in Focused Ion Beam-patterned nanostructures -- Chapter 19: Nanostructures by mass-separated FIB -- Index.
520 _aFIB Nanostructures reviews a range of methods, including milling, etching, deposition, and implantation, applied to manipulate structures at the nanoscale. Focused Ion Beam (FIB) is an important tool for manipulating the structure of materials at the nanoscale, and substantially extends the range of possible applications of nanofabrication. FIB techniques are widely used in the semiconductor industry and in materials research for deposition and ablation, including the fabrication of nanostructures such as nanowires, nanotubes, nanoneedles, graphene sheets, quantum dots, etc. The main objective of this book is to create a platform for knowledge sharing and dissemination of the latest advances in novel areas of FIB for nanostructures and related materials and devices, and to provide a comprehensive introduction to the field and directions for further research. Chapters written by leading scientists throughout the world create a fundamental bridge between focused ion beam and nanotechnology that is intended to stimulate readers' interest in developing new types of nanostructures for application to semiconductor technology. These applications are increasingly important for the future development of materials science, energy technology, and electronic devices. The book can be recommended for physics, electric engineering, and materials science departments as a reference on materials science and device design. Offers comprehensive coverage of novel nanostructures fabricated by focused ion beam Provides the keys to understanding the emerging area of FIB nanostructures Written by leading experts in each research area Describes a key enabling technology forming a bridge between materials science research and the development of energy-related and other electronic devices.
650 0 _aMaterials science.
650 0 _aNanochemistry.
650 0 _aNanoscale science.
650 0 _aNanoscience.
650 0 _aNanostructures.
650 0 _aSemiconductors.
650 0 _aNanotechnology.
650 0 _aOptical materials.
650 0 _aElectronic materials.
650 1 4 _aMaterials Science.
650 2 4 _aNanotechnology.
650 2 4 _aSemiconductors.
650 2 4 _aNanotechnology and Microengineering.
650 2 4 _aNanochemistry.
650 2 4 _aNanoscale Science and Technology.
650 2 4 _aOptical and Electronic Materials.
700 1 _aWang, Zhiming M.
_eeditor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9783319028736
830 0 _aLecture Notes in Nanoscale Science and Technology,
_x2195-2159 ;
_v20
856 4 0 _uhttp://dx.doi.org/10.1007/978-3-319-02874-3
912 _aZDB-2-CMS
942 _2Dewey Decimal Classification
_ceBooks
999 _c45553
_d45553