000 00943nam a22002657a 4500
001 sulbI000741
003 BD-SySUS
005 20160522165520.0
008 160522s1990 nyua b 001 0 eng d
020 _a0824783956 (alk. paper)
040 _aDLC
_cDLC
_dDLC
_dBD-SySUS
082 0 0 _a621.36
_222
_bSIO
100 1 _aSirohi, R. S.
_924781
245 1 0 _aOptical components, systems, and measurement techniques /
_cRajpal S. Sirohi, Mahendra P. Kothiyal.
260 _aNew York :
_bM. Dekker,
_cc1991.
300 _aviii, 445 p. :
_bill. ;
_c24 cm.
490 1 _aOptical engineering ;
_v28
504 _aIncludes bibliographical references and index.
650 0 _aOptical measurements.
_924782
650 0 _aLasers.
_915267
650 0 _aOptical instruments.
_924783
700 1 _aKothiyal, Mahendra P.,
_d1949-
_924784
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0647/90020940-d.html
942 _2ddc
_cBK
999 _c60672
_d60672