| 000 | 01204nam a22003017a 4500 | ||
|---|---|---|---|
| 001 | sulbI000867 | ||
| 003 | BD-SySUS | ||
| 005 | 20160524161839.0 | ||
| 008 | 160524s2006 njua b 001 0 eng d | ||
| 020 | _a0471739065 (acidfree paper) | ||
| 020 | _a9780471739067 | ||
| 035 | _a(OCoLC)ocm59360243 | ||
| 040 |
_aDLC _cDLC _dBAKER _dUKM _dC#P _dDLC _dBD-SySUS |
||
| 082 | 0 | 0 |
_a621.38152 _222 _bSCS |
| 100 | 1 |
_aSchroder, Dieter K. _925490 |
|
| 245 | 1 | 0 |
_aSemiconductor material and device characterization / _cDieter K. Schroder. |
| 250 | _a3rd ed. | ||
| 260 |
_a[Piscataway, NJ] : _bIEEE Press ; _aHoboken, N.J. : _bWiley, _cc2006. |
||
| 300 |
_axv, 779 p. : _bill. ; _c25 cm. |
||
| 500 | _a"Wiley-Interscience." | ||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aSemiconductors. _915189 |
|
| 650 | 0 |
_aSemiconductors _xTesting. _925491 |
|
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0645/2005048514-d.html |
| 856 | 4 | 1 |
_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy0645/2005048514-t.html |
| 856 | 4 | 2 |
_3Contributor biographical information _uhttp://www.loc.gov/catdir/enhancements/fy0654/2005048514-b.html |
| 942 |
_2ddc _cBK |
||
| 999 |
_c60963 _d60963 |
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