000 01270nam a22002897a 4500
001 sulbI000154
003 BD-SySUS
005 20160525100547.0
008 160525s2006 njua b 001 0 eng d
020 _a0471784060 (cloth : alk. paper)
020 _a9780471784067
040 _aDLC
_cDLC
_dUKM
_dBAKER
_dC#P
_dCOO
_dDLC
_dBD-SySUS
082 0 0 _a621.38152
_222
_bMAF
100 1 _aMay, Gary S.
_925721
245 1 0 _aFundamentals of semiconductor manufacturing and process control /
_cGary S. May, Costas J. Spanos.
260 _a[Piscataway] :
_bIEEE ;
_aHoboken, N.J. :
_bWiley-Interscience,
_cc2006.
300 _axix, 463 p. :
_bill. ;
_c25 cm.
504 _aIncludes bibliographical references and index.
650 0 _aSemiconductors
_xDesign and construction.
_915509
650 0 _aIntegrated circuits
_xDesign and construction.
_915508
650 0 _aProcess control
_xStatistical methods.
_911544
700 1 _aSpanos, Costas J.
_925722
856 4 1 _3Table of contents
_uhttp://www.loc.gov/catdir/toc/ecip061/2005028448.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0660/2005028448-d.html
856 4 2 _3Contributor biographical information
_uhttp://www.loc.gov/catdir/enhancements/fy0740/2005028448-b.html
942 _2ddc
_cBK
999 _c61048
_d61048