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_a10.1002/9781118084328 _bWiley InterScience _nhttp://www3.interscience.wiley.com |
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_aTL3000 _b.P48 2011 |
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_a629.1 _222 |
| 049 | _aMAIN | ||
| 100 | 1 |
_aPetersen, Edward, _d1932- _eauthor. |
|
| 245 | 1 | 0 |
_aSingle event effects in aerospace / _cEdward Petersen. |
| 264 | 1 |
_aPiscataway, NJ : _bIEEE Press ; _aHoboken, N.J. : _bWiley, _c[2011] |
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| 264 | 4 | _c©2011 | |
| 300 |
_a1 online resource (xiii, 502 pages : _billustrations |
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| 336 |
_atext _btxt _2rdacontent |
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| 336 |
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| 337 |
_acomputer _bc _2rdamedia |
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| 504 | _aIncludes bibliographical references (pages 455-487) and indexes. | ||
| 505 | 0 | _a1. Introduction. 1.1 Background. 1.2 Analysis of Single Event Experiments. 1.3 Modeling Space and Avionics See Rates. 1.4 Overview of this Book. 1.5 Scope of this Book -- 2. Foundations of Single Event Analysis and Prediction. 2.1 Overview of Single Particle Effects. 2.2 Particle Energy Deposition. 2.3 Single Event Environments. 2.4 Charge Collection and Upset. 2.5 Effective Let. 2.6 Charge Collection Volume and the Rectangular Parallelepiped (RPP). 2.7 Upset Cross Section Curves. 2.8 Critical Charge. 2.9 Upset Sensitivity and Feature Size. 2.10 Cross-Section Concepts -- 3. Optimizing Heavy Ion Experiments for Analysis. 3.1 Sample Heavy Ion Data. 3.2 Test Requirements. 3.3 Curve Parameters. 3.4 Angular Steps. 3.5 Stopping Data Accumulation When You Reach the Saturation Cross Section. 3.6 Device Shadowing Effects. 3.7 Choice of Ions. 3.8 Determining the LET in the Device. 3.9 Energy Loss Spread. 3.10 Data Requirements. 3.11 Experimental Statistics and Uncertainties. 3.12 Effect of Dual Thresholds. 3.13 Fitting Cross-Section Data. 3.14 Other Sources of Error and Uncertainties -- | |
| 505 | 8 | _a4. Optimizing Proton Testing. 4.1 Monitoring the Beam Intensity and Uniformity. 4.2 Total Dose Limitations on Testing. 4.3 Shape of the Cross-Section Curve -- 5. Data Qualification and Interpretation. 5.1 Data Characteristics. 5.2 Approaches to Problem Data. 5.3 Interpretation of Heavy Ion Experiments. 5.4 Possible Problems with Least Square Fitting Using the Weibull Function -- 6. Analysis of Various Types of SEU Data. 6.1 Critical Charge. 6.2 Depth and Critical Charge. 6.3 Charge Collection Mechanisms. 6.4 Charge Collection and the Cross-Section Curve. 6.5 Efficacy (Variation of SEU Sensitivity within a Cell). 6.6 Mixed-Mode Simulations. 6.7 Parametric Studies of Device Sensitivity. 6.8 Influence of Ion Species and Energy. 6.9 Device Geometry and the Limiting Cross Section. 6.10 Track Size Effects. 6.11 Cross-Section Curves and the Charge Collection Processes. 6.12 Single Event Multiple-Bit Upset. 6.13 SEU in Logic Systems. 6.14 Transient Pulses -- | |
| 505 | 8 | _a7. Cosmic Ray Single Event Rate Calculations. 7.1 Introduction to Rate Prediction Methods. 7.2 The RPP Approach to Heavy Ion Upset Rates. 7.3 The Integral RPP Approach. 7.4 Shape of the Cross-Section Curve. 7.5 Assumptions Behind the RPP and IRPP Methods. 7.6 Effective Flux Approach. 7.7 Upper Bound Approaches. 7.8 Figure of Merit Upset Rate Equations. 7.9 Generalized Figure of Merit. 7.10 The FOM and the LOG Normal Distribution. 7.11 Monte Carlo Approaches. 7.12 PRIVIT. 7.13 Integral Flux Method -- 8. Proton Single Event Rate Calculations. 8.1 Nuclear Reaction Analysis. 8.2 Semiempirical Approaches and the Integral Cross-Section Calculation. 8.3 Relationship of Proton and Heavy Ion Upsets. 8.4 Correlation of the FOM with Proton Upset Cross Sections. 8.5 Upsets Due to Rare High Energy Proton Reactions. 8.6 Upset Due to Ionization by Stopping Protons, Helium Ions, and Iron Ions -- 9. Neutron Induced Upset. 9.1 Neutron Upsets in Avionics. 9.2 Upsets at Ground Level -- | |
| 505 | 8 | _a10. Upsets Produced by Heavy Ion Nuclear Reactions. 10.1 Heavy Ion Nuclear Reactions. 10.2 Upset Rate Calculations for Combined Ionization and Reactions. 10.3 Heavy Nuclear Ion Reactions Summary -- 11. Samples of Heavy Ion Rate Prediction. 11.1 Low Threshold Studies. 11.2 Comparison of Upset Rates for Weibull and Lognormal Functions. 11.3 Low Threshold-Medium Lc data. 11.4 See Sensitivity and LET Thresholds. 11.5 Choosing Area and Depth for Rate Calculations. 11.6 Running CREME96 Type Codes. 11.7 CREME-MC and SPENVIS. 11.8 Effect of Uncertainties in Cross Section on Upset Rates -- 12. Samples of Proton Rate Predictions. 12.1 Trapped Protons. 12.2 Correlation of the FOM with Proton Upset Rates -- 13. Combined Environments. 13.1 Relative Proton and Cosmic Ray Upset Rates. 13.2 Calculation of Combined Rates Using the Figure of Merit. 13.3 Rate Coefficients for a Particular New Orbit. 13.4 Rate Coefficients for Any Circular Orbit About the Earth. 13.5 Ratio of Proton to Heavy Ion Upsets for Near Earth Circular Orbits. 13.6 Single Events from Ground to Outer Space -- | |
| 505 | 8 | _a14. Samples of Solar Events and Extreme Situations -- 15. Upset Rates in Neutral Particle Beam (NPB) Environments. 15.1 Characteristics of NPB Weapons. 15.2 Upsets in the NPB Beam -- 16. Predictions and Observations of SEU Rates in Space. 16.1 Results of Space Observations. 16.2 Environmental Uncertainties. 16.3 Examination of Outliers. 16.4 Possible Reasons for Poor Upset Rate Predictions. 16.5 Constituents of a Good Rate Comparison Paper. 16.6 Summary and Conclusions. 16.7 Recent Comparisons. 16.8 Comparisons with Events During Solar Activity -- | |
| 505 | 8 | _a17. Limitations of the IRPP Approach. 17.1 The IRPP and Deep Devices. 17.2 The RPP When Two Hits are Required. 17.3 The RPP Approaches Neglect Track Size. 17.4 The IRPP Calculates Number of Events, not Total Number of Upsets. 17.5 The RPP Approaches Neglect Effects that Arise Outside the Sensitive Volume. 17.6 The IRPP Approaches Assume that the Effect of Different Particles with the Same LET is Equivalent. 17.7 The IRPP Approaches Assume that the LET of the Particle is not Changing in the Sensitive Volume. 17.8 The IRPP Approach Assumes that the Charge Collection Does Not Change with Device Orientation. 17.9 The Status of Single Event Rate Analysis -- Appendix A Useful Numbers. Appendix B Reference Equations. Appendix C Quick Estimates of Upset Rates Using the Figure of Merit. Appendix D Part Characteristics. Appendix E Sources of Device Data. | |
| 520 | _a"Enables readers to better understand, calculate, and manage single event effectsSingle event effects, caused by single ionizing particles that penetrate sensitive nodes within an electronic device, can lead to anything from annoying system responses to catastrophic system failures. As electronic components continue to become smaller and smaller due to advances in miniaturization, electronic components designed for avionics are increasingly susceptible to these single event phenomena. With this book in hand, readers learn the core concepts needed to understand, predict, and manage disruptive and potentially damaging single event effects. Setting the foundation, the book begins with a discussion of the radiation environments in space and in the atmosphere. Next, the book draws together and analyzes some thirty years of findings and best practices reported in the literature, exploring such critical topics as: Design of heavy ion and proton experiments to optimize the data needed for single event predictions; Data qualification and analysis, including multiple bit upset and parametric studies of device sensitivity; Pros and cons of different approaches to heavy ion, proton, and neutron rate predictions; Results of experiments that have tested space predictions. Single Event Effects in Aerospace is recommended for engineers who design or fabricate parts, subsystems, or systems used in avionics, missile, or satellite applications. It not only provides them with a current understanding of single event effects, it also enables them to predict single event rates in aerospace environments in order to make needed design adjustments."--Publisher's description. | ||
| 650 | 0 |
_aAstrionics _xProtection. |
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| 650 | 0 |
_aElectronic apparatus and appliances _xEffect of radiation on. |
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| 650 | 0 | _aElectromagnetic pulse. | |
| 650 | 7 |
_aAstrionics _2fast _0(OCoLC)fst00819376 |
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| 650 | 7 |
_aElectric apparatus and appliances _xProtection _2fast _0(OCoLC)fst00904438 |
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| 650 | 7 |
_aElectronic apparatus and appliances _xEffect of radiation on _2fast _0(OCoLC)fst00906792 |
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| 650 | 7 |
_aElectromagnetic pulse _2fast _0(OCoLC)fst00906564 |
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| 650 | 7 |
_aTECHNOLOGY & ENGINEERING / Aeronautics & Astronautics _2bisacsh |
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| 655 | 0 | _aElectronic books | |
| 776 | 0 | 8 |
_iPrint version: _aPetersen, Edward, 1932- _tSingle event effects in aerospace. _d[Piscataway, N.J.?] : IEEE Press ; Hoboken, N.J. : Wiley, c2011 _z9780470767498 _w(DLC) 2011002191 _w(OCoLC)635494028 |
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_uhttp://onlinelibrary.wiley.com/book/10.1002/9781118084328 _zWiley Online Library [Free Download only for SUST IP] |
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