000 00740nam a2200193 a 4500
001 sulb270
008 130320s1985 nyua b 001 0 eng d
020 _a0471896349
040 _aDLC
_cDLC
_dDLC
_dBD-SySUS
082 0 0 _a543
_222
100 1 _aVan Loon, J. C.
245 1 0 _aSelected methods of trace metal analysis :
_bbiological and environmental samples /
_cJon C. Van Loon.
260 _aNew York :
_bWiley,
_cc1985.
300 _aV.80, xix, 357 p. :
_bill. ;
_c24 cm.
504 _aIncludes bibliographies and index.
650 0 _aTrace elements
_xAnalysis.
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/description/wiley033/85003279.html
856 4 _3Table of Contents
_uhttp://www.loc.gov/catdir/toc/onix04/85003279.html
999 _c8406
_d8406