000 | 00765am a2200193a 44500 | ||
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001 | ulb5810 | ||
008 | 130320s1987 si a 000 0 eng | ||
020 | _a9971505118 | ||
040 |
_aBD-SySUS _cBD-SySUS |
||
082 | 0 | 0 |
_a543 _222 |
245 | 1 | 0 |
_aAnalytical techniques for material characterization : _bproceedings of the international workshop, Baton Rouge, USA, 11-16 May 1987 / _cedited by W. E. Collins, B. V. R. Chowdari, S. Radhakrishna. |
260 |
_aSingapore : _bWorld Scientific Pub. Co, _cc1987. |
||
300 |
_axiii, 407 p. : _bill. ; _c23 cm. |
||
504 | _aIncludes bibliographical references and index. | ||
650 | 0 | _aAnalytical techniques for material characterization. | |
700 | 1 | _aCollins, W. E. | |
700 | 1 | _aChowdari, B. V. R. | |
700 | 1 | _aRadhakrishna, S. | |
999 |
_c8409 _d8409 |