000 | 00815nam a2200229 a 4500 | ||
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001 | sulb26244 | ||
008 | 130317s1991 nyua b 001 0 eng d | ||
020 | _a0824785061 | ||
040 |
_aDLC _cDLC _dDLC _dBD-SySUS |
||
082 | 0 | 0 |
_a620.00452 _222 |
100 | 1 |
_aBain, Lee J., _d1939- |
|
245 | 1 | 0 |
_aStatistical analysis of reliability and life-testing models : _btheory and methods / _cLee J. Bain, Max Engelhardt. |
250 | _a2nd ed. | ||
260 |
_aNew York : _bM. Dekker, _cc1991. |
||
300 |
_avii, 496 p. : _bill. ; _c24 cm. |
||
504 | _aIncludes bibliographical references (p. 479-491) and index. | ||
650 | 0 |
_aReliability (Engineering) _xStatistical methods. |
|
650 | 0 | _aAccelerated life testing. | |
650 | 0 | _aDistribution (Probability theory) | |
650 | 0 | _aMathematical statistics. | |
700 | 1 | _aEngelhardt, Max. | |
999 |
_c8675 _d8675 |