000 00815nam a2200229 a 4500
001 sulb26244
008 130317s1991 nyua b 001 0 eng d
020 _a0824785061
040 _aDLC
_cDLC
_dDLC
_dBD-SySUS
082 0 0 _a620.00452
_222
100 1 _aBain, Lee J.,
_d1939-
245 1 0 _aStatistical analysis of reliability and life-testing models :
_btheory and methods /
_cLee J. Bain, Max Engelhardt.
250 _a2nd ed.
260 _aNew York :
_bM. Dekker,
_cc1991.
300 _avii, 496 p. :
_bill. ;
_c24 cm.
504 _aIncludes bibliographical references (p. 479-491) and index.
650 0 _aReliability (Engineering)
_xStatistical methods.
650 0 _aAccelerated life testing.
650 0 _aDistribution (Probability theory)
650 0 _aMathematical statistics.
700 1 _aEngelhardt, Max.
999 _c8675
_d8675