| 000 | 00968nam a2200241 a 4500 | ||
|---|---|---|---|
| 001 | sulb42789 | ||
| 008 | 130321s1998 nyua b 001 0 eng d | ||
| 020 | _a0471241393 (cloth : alk. paper) | ||
| 040 |
_aDLC _cDLC _dDLC _dBD-SySUS |
||
| 082 | 0 | 0 |
_a621.38152 _222 |
| 100 | 1 | _aSchroder, Dieter K. | |
| 245 | 0 | 0 |
_aSemiconductor material and device characterization / _cDieter K. Schroder. |
| 250 | _a2nd ed. | ||
| 260 |
_aNew York : _bWiley, _cc1998. |
||
| 300 |
_axxiv, 760 p. : _bill. ; _c25 cm. |
||
| 500 | _a"A Wiley-Interscience publication." | ||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 | _aSemiconductors. | |
| 650 | 0 |
_aSemiconductors _xTesting. |
|
| 856 | 4 | 2 |
_3Contributor biographical information _uhttp://www.loc.gov/catdir/bios/wiley047/97052094.html |
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/description/wiley032/97052094.html |
| 856 | 4 |
_3Table of Contents _uhttp://www.loc.gov/catdir/toc/onix02/97052094.html |
|
| 999 |
_c9034 _d9034 |
||