| 000 | 00698nam a2200193 a 4500 | ||
|---|---|---|---|
| 001 | sulb161 | ||
| 008 | 130321s1987 ja a b 101 0 eng d | ||
| 020 | _a9027723524 (D. Reidel) | ||
| 040 |
_aDLC _cDLC _dDLC _dBD-SySUS |
||
| 082 | 0 | 0 |
_a621.38152 _222 |
| 245 | 0 | 0 |
_aDefects and properties of semiconductors : _bdefect engineering / _cedited by J. Chikawa, K. Sumino, and K. Wada. |
| 260 |
_aTokyo : _bKTK Scientific , _cc1987. |
||
| 300 |
_avi, 261 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographies and index. | ||
| 650 | 0 |
_aSemiconductors _xDefects _xCongresses. |
|
| 700 | 1 |
_aChikawa, J. _q(Junichi), _d1930- |
|
| 700 | 1 |
_aSumino, K. _q(K�oji), _d1931- |
|
| 700 | 1 |
_aWada, K. _q(Kazumi), _d1950- |
|
| 999 |
_c9249 _d9249 |
||