Normal view MARC view ISBD view

Testing for small-delay defects in nanoscale CMOS integrated circuits /

Testing for small-delay defects in nanoscale CMOS integrated circuits / edited by Sandeep K. Goel, Krishnendu Chakrabarty. - 1 online resource : text file, PDF - Devices, circuits, and systems .

Includes bibliographical references and index.

ISBN: 9781439829424 (e-book : PDF)

Subjects--Topical Terms:
Metal oxide semiconductors, Complementary--Testing.

Print
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)