Testing for small-delay defects in nanoscale CMOS integrated circuits / (Record no. 24214)
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000 -LEADER | |
---|---|
fixed length control field | 00819pam a2200181 a 4500 |
001 - CONTROL NUMBER | |
control field | sulb-eb0003873 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 150323s2014 fluad ob 001 0 eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9781439829424 (e-book : PDF) |
040 ## - CATALOGING SOURCE | |
Original cataloging agency | FlBoTFG |
Transcribing agency | FlBoTFG |
Modifying agency | BD-SySUS |
245 00 - TITLE STATEMENT | |
Title | Testing for small-delay defects in nanoscale CMOS integrated circuits / |
Statement of responsibility, etc. | edited by Sandeep K. Goel, Krishnendu Chakrabarty. |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 1 online resource : |
Other physical details | text file, PDF |
490 1# - SERIES STATEMENT | |
Series statement | Devices, circuits, and systems |
504 ## - BIBLIOGRAPHY, ETC. NOTE | |
Bibliography, etc | Includes bibliographical references and index. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Metal oxide semiconductors, Complementary |
General subdivision | Testing. |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Goel, Sandeep K, |
Relator term | editor of compilation. |
Personal name | Chakrabarty, Krishnendu, |
Relator term | editor of compilation. |
856 40 - ELECTRONIC LOCATION AND ACCESS | |
Uniform Resource Identifier | <a href="http://marc.crcnetbase.com/isbn/9781439829424">http://marc.crcnetbase.com/isbn/9781439829424</a> |
Electronic format type | application/PDF |
Public note | Read Online / DOWNLOAD. |
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