Testing for small-delay defects in nanoscale CMOS integrated circuits /
Testing for small-delay defects in nanoscale CMOS integrated circuits /
edited by Sandeep K. Goel, Krishnendu Chakrabarty.
- 1 online resource : text file, PDF
- Devices, circuits, and systems .
Includes bibliographical references and index.
9781439829424 (ebook : PDF)
Metal oxide semiconductors, Complementary--Testing.
Includes bibliographical references and index.
9781439829424 (ebook : PDF)
Metal oxide semiconductors, Complementary--Testing.