Testing for small-delay defects in nanoscale CMOS integrated circuits / (Record no. 24261)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00818pam a2200181 a 4500 |
| 001 - CONTROL NUMBER | |
| control field | sulb-eb0003920 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 150323s2014 fluad ob 001 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781439829424 (ebook : PDF) |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | FlBoTFG |
| Transcribing agency | FlBoTFG |
| Modifying agency | BD-SySUS |
| 245 00 - TITLE STATEMENT | |
| Title | Testing for small-delay defects in nanoscale CMOS integrated circuits / |
| Statement of responsibility, etc. | edited by Sandeep K. Goel, Krishnendu Chakrabarty. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 1 online resource : |
| Other physical details | text file, PDF |
| 490 1# - SERIES STATEMENT | |
| Series statement | Devices, circuits, and systems |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc | Includes bibliographical references and index. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Metal oxide semiconductors, Complementary |
| General subdivision | Testing. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Goel, Sandeep K, |
| Relator term | editor of compilation. |
| Personal name | Chakrabarty, Krishnendu, |
| Relator term | editor of compilation. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | <a href="http://marc.crcnetbase.com/isbn/9781439829424">http://marc.crcnetbase.com/isbn/9781439829424</a> |
| Electronic format type | application/PDF |
| Public note | Read Online / DOWNLOAD. |
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