Advanced characterization techniques for thin film solar cells / (Record no. 62793)
[ view plain ]
| 000 -LEADER | |
|---|---|
| fixed length control field | 20072cam a2200913Ka 4500 |
| 001 - CONTROL NUMBER | |
| control field | sulb-eb0031141 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | BD-SySUS |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20170713221248.0 |
| 006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS | |
| fixed length control field | m o d |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
| fixed length control field | cr cnu---unuuu |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 111017s2011 gw a ob 001 0 eng d |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | N$T |
| Language of cataloging | eng |
| Description conventions | pn |
| Transcribing agency | N$T |
| Modifying agency | DG1 |
| -- | YDXCP |
| -- | DEBSZ |
| -- | CDX |
| -- | E7B |
| -- | OCLCQ |
| -- | EBLCP |
| -- | OCLCQ |
| -- | B24X7 |
| -- | OCLCQ |
| -- | COO |
| -- | NLGGC |
| -- | OCLCQ |
| -- | DEBBG |
| -- | BD-SySUS |
| 019 ## - | |
| -- | 714799132 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9783527636303 |
| Qualifying information | (electronic bk.) |
| International Standard Book Number | 3527636307 |
| Qualifying information | (electronic bk.) |
| International Standard Book Number | 9783527636280 |
| Qualifying information | (electronic bk.) |
| International Standard Book Number | 3527636285 |
| Qualifying information | (electronic bk.) |
| International Standard Book Number | 9783527636297 |
| Qualifying information | (ePub) |
| International Standard Book Number | 3527636293 |
| Qualifying information | (ePub) |
| International Standard Book Number | 9783527636310 |
| Qualifying information | (Mobi) |
| International Standard Book Number | 3527636315 |
| Qualifying information | (Mobi) |
| Canceled/invalid ISBN | 3527410031 |
| Canceled/invalid ISBN | 9783527410033 |
| 029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC) | |
| OCLC library identifier | AU@ |
| System control number | 000047551147 |
| OCLC library identifier | DEBSZ |
| System control number | 347955517 |
| OCLC library identifier | DEBSZ |
| System control number | 372814980 |
| OCLC library identifier | DEBSZ |
| System control number | 430997469 |
| OCLC library identifier | NLGGC |
| System control number | 338323414 |
| OCLC library identifier | NZ1 |
| System control number | 16077594 |
| OCLC library identifier | DEBBG |
| System control number | BV043393565 |
| 035 ## - SYSTEM CONTROL NUMBER | |
| System control number | (OCoLC)757401381 |
| Canceled/invalid control number | (OCoLC)714799132 |
| 037 ## - SOURCE OF ACQUISITION | |
| Stock number | 10.1002/9783527636280 |
| Source of stock number/acquisition | Wiley InterScience |
| Note | http://www3.interscience.wiley.com |
| 050 #4 - LIBRARY OF CONGRESS CALL NUMBER | |
| Classification number | TK8322 |
| Item number | .A38 2011eb |
| 072 #7 - SUBJECT CATEGORY CODE | |
| Subject category code | TEC |
| Subject category code subdivision | 009070 |
| Source | bisacsh |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.472 |
| Edition number | 22 |
| 049 ## - LOCAL HOLDINGS (OCLC) | |
| Holding library | MAIN |
| 245 00 - TITLE STATEMENT | |
| Title | Advanced characterization techniques for thin film solar cells / |
| Statement of responsibility, etc. | edited by Daniel Abou-Ras, Thomas Kirchartz, and Uwe Rau. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc. | Weinheim, Germany : |
| Name of publisher, distributor, etc. | Wiley-VCH, |
| Date of publication, distribution, etc. | ©2011. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 1 online resource (xxxvi, 547 pages) : |
| Other physical details | illustrations (some color) |
| 336 ## - CONTENT TYPE | |
| Content type term | text |
| Content type code | txt |
| Source | rdacontent |
| 337 ## - MEDIA TYPE | |
| Media type term | computer |
| Media type code | c |
| Source | rdamedia |
| 338 ## - CARRIER TYPE | |
| Carrier type term | online resource |
| Carrier type code | cr |
| Source | rdacarrier |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc | Includes bibliographical references and index. |
| 505 00 - FORMATTED CONTENTS NOTE | |
| Miscellaneous information | Machine generated contents note: |
| -- | pt. one |
| Title | Introduction -- |
| Miscellaneous information | 1. |
| Title | Introduction to Thin-Film Photovoltaics / |
| Statement of responsibility | Uwe Rau -- |
| Miscellaneous information | 1.1. |
| Title | Introduction -- |
| Miscellaneous information | 1.2. |
| Title | The Photovoltaic Principle -- |
| Miscellaneous information | 1.2.1. |
| Title | The Shockley-Queisser Theory -- |
| Miscellaneous information | 1.2.2. |
| Title | From the Ideal Solar Cell to Real Solar Cells -- |
| Miscellaneous information | 1.2.3. |
| Title | Light Absorption and Light Trapping -- |
| Miscellaneous information | 1.2.4. |
| Title | Charge Extraction -- |
| Miscellaneous information | 1.2.5. |
| Title | Nonradiative Recombination -- |
| Miscellaneous information | 1.3. |
| Title | Functional Layers in Thin-Film Solar Cells -- |
| Miscellaneous information | 1.4. |
| Title | Comparison of Various Thin-Film Solar-Cell Types -- |
| Miscellaneous information | 1.4.1. |
| Title | Cu(In, Ga)Se2 -- |
| Miscellaneous information | 1.4.1.1. |
| Title | Basic Properties and Technology -- |
| Miscellaneous information | 1.4.1.2. |
| Title | Layer-Stacking Sequence and Band Diagram of the Heterostructure -- |
| Miscellaneous information | 1.4.2. |
| Title | CdTe -- |
| Miscellaneous information | 1.4.2.1. |
| Title | Basic Properties and Technology -- |
| Miscellaneous information | 1.4.2.2. |
| Title | Layer-Stacking Sequence and Band Diagram of the Heterostructure -- |
| Miscellaneous information | 1.4.3. |
| Title | Thin-Film Silicon Solar Cells -- |
| Miscellaneous information | 1.4.3.1. |
| Title | Hydrogenated Amorphous Si (a-Si: H) -- |
| Miscellaneous information | 1.4.3.2. |
| Title | Metastability in a-Si: H: The Staebler-Wronski Effect -- |
| Miscellaneous information | 1.4.3.3. |
| Title | Hydrogenated Microcrystalline Silicon (& mu;c-Si: H) -- |
| Miscellaneous information | 1.4.3.4. |
| Title | Micromorph Tandem Solar Cells. |
| Miscellaneous information | 1.5. |
| Title | Conclusions -- |
| -- | References -- |
| Miscellaneous information | pt. Two |
| Title | Device Characterization -- |
| Miscellaneous information | 2. |
| Title | Fundamental Electrical Characterization of Thin-Film Solar Cells / |
| Statement of responsibility | Uwe Rau -- |
| Miscellaneous information | 2.1. |
| Title | Introduction -- |
| Miscellaneous information | 2.2. |
| Title | Current/Voltage Curves -- |
| Miscellaneous information | 2.2.1. |
| Title | Shape of Current/Voltage Curves and their Description with Equivalent Circuit Models -- |
| Miscellaneous information | 2.2.2. |
| Title | Measurement of Current/Voltage Curves -- |
| Miscellaneous information | 2.2.3. |
| Title | Determination of Ideality Factors and Series Resistances -- |
| Miscellaneous information | 2.2.4. |
| Title | Temperature-Dependent Current/Voltage Measurements -- |
| Miscellaneous information | 2.3. |
| Title | Quantum Efficiency Measurements -- |
| Miscellaneous information | 2.3.1. |
| Title | Definition -- |
| Miscellaneous information | 2.3.2. |
| Title | Measurement Principle and Calibration -- |
| Miscellaneous information | 2.3.3. |
| Title | Quantum Efficiency Measurements of Tandem Solar Cells -- |
| Miscellaneous information | 2.3.4. |
| Title | Differential Spectral Response (DSR) Measurements -- |
| Miscellaneous information | 2.3.5. |
| Title | Interpretation of Quantum Efficiency Measurements in Thin-Film Silicon Solar Cells -- |
| -- | References -- |
| Miscellaneous information | 3. |
| Title | Electroluminescence Analysis of Solar Cells and Solar Modules / |
| Statement of responsibility | Uwe Rau -- |
| Miscellaneous information | 3.1. |
| Title | Introduction -- |
| Miscellaneous information | 3.2. |
| Title | Basics -- |
| Miscellaneous information | 3.3. |
| Title | Spectrally Resolved Electroluminescence -- |
| Miscellaneous information | 3.4. |
| Title | Spatially Resolved Electroluminescence of c-Si Solar Cells -- |
| Miscellaneous information | 3.5. |
| Title | Electroluminescence Imaging of Cu(In, Ga)Se2 Thin-Film Modules. |
| Miscellaneous information | 3.6. |
| Title | Modeling of Spatially Resolved Electroluminescence -- |
| -- | References -- |
| Miscellaneous information | 4. |
| Title | Capacitance Spectroscopy of Thin-Film Solar Cells / |
| Statement of responsibility | Pawel Zabierowski -- |
| Miscellaneous information | 4.1. |
| Title | Introduction -- |
| Miscellaneous information | 4.2. |
| Title | Admittance Basics -- |
| Miscellaneous information | 4.3. |
| Title | Sample Requirements -- |
| Miscellaneous information | 4.4. |
| Title | Instrumentation -- |
| Miscellaneous information | 4.5. |
| Title | Capacitance-Voltage Profiling and the Depletion Approximation -- |
| Miscellaneous information | 4.6. |
| Title | Admittance Response of Deep States -- |
| Miscellaneous information | 4.7. |
| Title | The Influence of Deep States on CV Profiles -- |
| Miscellaneous information | 4.8. |
| Title | DLTS -- |
| Miscellaneous information | 4.8.1. |
| Title | DLTS of Thin-Film PV Devices -- |
| Miscellaneous information | 4.9. |
| Title | Admittance Spectroscopy -- |
| Miscellaneous information | 4.10. |
| Title | Drive Level Capacitance Profiling -- |
| Miscellaneous information | 4.11. |
| Title | Photocapacitance -- |
| Miscellaneous information | 4.12. |
| Title | The Meyer-Neldel Rule -- |
| Miscellaneous information | 4.13. |
| Title | Spatial Inhomogeneities and Interface States -- |
| Miscellaneous information | 4.14. |
| Title | Metastability -- |
| -- | References -- |
| Miscellaneous information | pt. Three |
| Title | Materials Characterization -- |
| Miscellaneous information | 5. |
| Title | Characterizing the Light-Trapping Properties of Textured Surfaces with Scanning Near-Field Optical Microscopy / |
| Statement of responsibility | Karsten Bittkau -- |
| Miscellaneous information | 5.1. |
| Title | Introduction -- |
| Miscellaneous information | 5.2. |
| Title | How Does a Scanning Near-Field Optical Microscope Work? -- |
| Miscellaneous information | 5.3. |
| Title | Light Scattering in the Wave Picture -- |
| Miscellaneous information | 5.4. |
| Title | The Role of Evanescent Modes for Light Trapping -- |
| Miscellaneous information | 5.5. |
| Title | Analysis of Scanning Near-Field Optical Microscopy Images by Fast Fourier Transformation. |
| Miscellaneous information | 5.6. |
| Title | How to Extract Far-Field Scattering Properties by Scanning Near-Field Optical Microscopy? -- |
| Miscellaneous information | 5.7. |
| Title | Conclusion -- |
| -- | References -- |
| Miscellaneous information | 6. |
| Title | Spectroscopic Ellipsometry / |
| Statement of responsibility | Robert W. Collins -- |
| Miscellaneous information | 6.1. |
| Title | Introduction -- |
| Miscellaneous information | 6.2. |
| Title | Theory -- |
| Miscellaneous information | 6.2.1. |
| Title | Polarized Light -- |
| Miscellaneous information | 6.2.2. |
| Title | Reflection from a Single Interface -- |
| Miscellaneous information | 6.3. |
| Title | Ellipsometry Instrumentation -- |
| Miscellaneous information | 6.3.1. |
| Title | Rotating Analyzer SE for Ex-Situ Applications -- |
| Miscellaneous information | 6.3.2. |
| Title | Rotating Compensator SE for Real-Time Applications -- |
| Miscellaneous information | 6.4. |
| Title | Data Analysis -- |
| Miscellaneous information | 6.4.1. |
| Title | Exact Numerical Inversion -- |
| Miscellaneous information | 6.4.2. |
| Title | Least-Squares Regression -- |
| Miscellaneous information | 6.4.3. |
| Title | Virtual Interface Analysis -- |
| Miscellaneous information | 6.5. |
| Title | RTSE of Thin Film Photovoltaics -- |
| Miscellaneous information | 6.5.1. |
| Title | Thin Si: H -- |
| Miscellaneous information | 6.5.2. |
| Title | CdTe -- |
| Miscellaneous information | 6.5.3. |
| Title | CuInSe2 -- |
| Miscellaneous information | 6.6. |
| Title | Summary and Future -- |
| Miscellaneous information | 6.7. |
| Title | Definition of Variables -- |
| -- | References -- |
| Miscellaneous information | 7. |
| Title | Photoluminescence Analysis of Thin-Film Solar Cells / |
| Statement of responsibility | Levent Gutay -- |
| Miscellaneous information | 7.1. |
| Title | Introduction -- |
| Miscellaneous information | 7.2. |
| Title | Experimental Issues -- |
| Miscellaneous information | 7.2.1. |
| Title | Design of the Optical System -- |
| Miscellaneous information | 7.2.2. |
| Title | Calibration -- |
| Miscellaneous information | 7.2.3. |
| Title | Cryostat -- |
| Miscellaneous information | 7.3. |
| Title | Basic Transitions -- |
| Miscellaneous information | 7.3.1. |
| Title | Excitons -- |
| Miscellaneous information | 7.3.2. |
| Title | Free-Bound Transitions -- |
| Miscellaneous information | 7.3.3. |
| Title | Donor-Acceptor Pair Recombination -- |
| Miscellaneous information | 7.3.4. |
| Title | Potential Fluctuations. |
| Miscellaneous information | 7.3.5. |
| Title | Band-Band Transitions -- |
| Miscellaneous information | 7.4. |
| Title | Case Studies -- |
| Miscellaneous information | 7.4.1. |
| Title | Low-Temperature Photoluminescence Analysis -- |
| Miscellaneous information | 7.4.2. |
| Title | Room-Temperature Measurements: Estimation of Voc from PL Yield -- |
| Miscellaneous information | 7.4.3. |
| Title | Spatially Resolved Photoluminescence: Absorber Inhomogeneities -- |
| -- | References -- |
| Miscellaneous information | 8. |
| Title | Steady-State Photocarrier Crating Method / |
| Statement of responsibility | Rudolf Bruggemann -- |
| Miscellaneous information | 8.1. |
| Title | Introduction -- |
| Miscellaneous information | 8.2. |
| Title | Basic Analysis of SSPG and Photocurrent Response -- |
| Miscellaneous information | 8.2.1. |
| Title | Optical Model -- |
| Miscellaneous information | 8.2.2. |
| Title | Semiconductor Equations -- |
| Miscellaneous information | 8.2.3. |
| Title | Diffusion Length: Ritter-Zeldov-Weiser Analysis -- |
| Miscellaneous information | 8.2.3.1. |
| Title | Evaluation Schemes -- |
| Miscellaneous information | 8.2.4. |
| Title | More Detailed Analyses -- |
| Miscellaneous information | 8.2.4.1. |
| Title | Influence of the Dark Conductivity -- |
| Miscellaneous information | 8.2.4.2. |
| Title | Influence of Traps -- |
| Miscellaneous information | 8.2.4.3. |
| Title | Minority-Carrier and Majority-Carrier Mobility-Lifetime Products -- |
| Miscellaneous information | 8.3. |
| Title | Experimental Setup -- |
| Miscellaneous information | 8.4. |
| Title | Data Analysis -- |
| Miscellaneous information | 8.5. |
| Title | Results -- |
| Miscellaneous information | 8.5.1. |
| Title | Hydrogenated Amorphous Silicon -- |
| Miscellaneous information | 8.5.1.1. |
| Title | Temperature and Generation Rate Dependence -- |
| Miscellaneous information | 8.5.1.2. |
| Title | Surface Recombination -- |
| Miscellaneous information | 8.5.1.3. |
| Title | Electric-Field Influence -- |
| Miscellaneous information | 8.5.1.4. |
| Title | Fermi-Level Position -- |
| Miscellaneous information | 8.5.1.5. |
| Title | Defects and Light-Induced Degradation. |
| Miscellaneous information | 8.5.1.6. |
| Title | Thin-Film Characterization and Deposition Methods -- |
| Miscellaneous information | 8.5.2. |
| Title | Hydrogenated Amorphous Silicon Alloys -- |
| Miscellaneous information | 8.5.3. |
| Title | Hydrogenated Microcrystalline Silicon -- |
| Miscellaneous information | 8.5.4. |
| Title | Hydrogenated Microcrystalline Germanium -- |
| Miscellaneous information | 8.5.5. |
| Title | Other Thin-Film Semiconductors -- |
| Miscellaneous information | 8.6. |
| Title | Density-of-States Determination -- |
| Miscellaneous information | 8.7. |
| Title | Summary -- |
| -- | References -- |
| Miscellaneous information | 9. |
| Title | Time-of-Flight Analysis / |
| Statement of responsibility | Torsten Bronger -- |
| Miscellaneous information | 9.1. |
| Title | Introduction -- |
| Miscellaneous information | 9.2. |
| Title | Fundamentals of TOF Measurements -- |
| Miscellaneous information | 9.2.1. |
| Title | Anomalous Dispersion -- |
| Miscellaneous information | 9.2.2. |
| Title | Basic Electronic Properties of Thin-Film Semiconductors -- |
| Miscellaneous information | 9.3. |
| Title | Experimental Details -- |
| Miscellaneous information | 9.3.1. |
| Title | Accompanying Measurements -- |
| Miscellaneous information | 9.3.1.1. |
| Title | Capacitance -- |
| Miscellaneous information | 9.3.1.2. |
| Title | Collection -- |
| Miscellaneous information | 9.3.1.3. |
| Title | Built-in Field -- |
| Miscellaneous information | 9.3.2. |
| Title | Current Decay -- |
| Miscellaneous information | 9.3.3. |
| Title | Charge Transient -- |
| Miscellaneous information | 9.3.4. |
| Title | Possible Problems -- |
| Miscellaneous information | 9.3.4.1. |
| Title | Dielectric Relaxation -- |
| Miscellaneous information | 9.3.5. |
| Title | Inhomogeneous Field -- |
| Miscellaneous information | 9.4. |
| Title | Analysis of TOF Results -- |
| Miscellaneous information | 9.4.1. |
| Title | Multiple Trapping -- |
| Miscellaneous information | 9.4.1.1. |
| Title | Overview of the Processes -- |
| Miscellaneous information | 9.4.1.2. |
| Title | Energetic Distribution of Carriers -- |
| Miscellaneous information | 9.4.1.3. |
| Title | Time Dependence of Electrical Current -- |
| Miscellaneous information | 9.4.2. |
| Title | Spatial Charge Distribution -- |
| Miscellaneous information | 9.4.2.1. |
| Title | Temperature Dependence. |
| Miscellaneous information | 9.4.3. |
| Title | Density of States -- |
| Miscellaneous information | 9.4.3.1. |
| Title | Widths of Band Tails -- |
| Miscellaneous information | 9.4.3.2. |
| Title | Probing of Deep States -- |
| -- | References -- |
| Miscellaneous information | 10. |
| Title | Electron-Spin Resonance (ESR) in Hydrogenated Amorphous Silicon (a-Si: H) / |
| Statement of responsibility | Jan Behrends -- |
| Miscellaneous information | 10.1. |
| Title | Introduction -- |
| Miscellaneous information | 10.2. |
| Title | Basics of ESR -- |
| Miscellaneous information | 10.3. |
| Title | How to Measure ESR -- |
| Miscellaneous information | 10.3.1. |
| Title | ESR Setup and Measurement Procedure -- |
| Miscellaneous information | 10.3.2. |
| Title | Pulse ESR -- |
| Miscellaneous information | 10.3.3. |
| Title | Sample Preparation -- |
| Miscellaneous information | 10.4. |
| Title | The g Tensor and Hyperfine Interaction in Disordered Solids -- |
| Miscellaneous information | 10.4.1. |
| Title | Zeeman Energy and g Tensor -- |
| Miscellaneous information | 10.4.2. |
| Title | Hyperfine Interaction -- |
| Miscellaneous information | 10.4.3. |
| Title | Line-Broadening Mechanisms -- |
| Miscellaneous information | 10.5. |
| Title | Discussion of Selected Results -- |
| Miscellaneous information | 10.5.1. |
| Title | ESR on Undoped a-Si: H -- |
| Miscellaneous information | 10.5.2. |
| Title | LESR on Undoped a-Si: H -- |
| Miscellaneous information | 10.5.3. |
| Title | ESR on Doped a-Si: H -- |
| Miscellaneous information | 10.5.4. |
| Title | Light-Induced Degradation in a-Si: H -- |
| Miscellaneous information | 10.5.4.1. |
| Title | Excess Charge-Carrier Recombination and Weak Si-Si Bond Breaking -- |
| Miscellaneous information | 10.5.4.2. |
| Title | Si-H Bond Dissociation and Hydrogen Collision Model -- |
| Miscellaneous information | 10.5.4.3. |
| Title | Transformation of Existing Nonparamagnetic Charged Dangling-Bond Defects -- |
| Miscellaneous information | 10.6. |
| Title | Alternative ESR Detection -- |
| Miscellaneous information | 10.6.1. |
| Title | History of EDMR -- |
| Miscellaneous information | 10.6.2. |
| Title | EDMR on a-Si: H Solar Cells. |
| Miscellaneous information | 10.7. |
| Title | Concluding Remarks -- |
| -- | References -- |
| Miscellaneous information | 11. |
| Title | Scanning Probe Microscopy on Inorganic Thin Films for Solar Cells / |
| Statement of responsibility | Iris Visoly-Fisher -- |
| Miscellaneous information | 11.1. |
| Title | Introduction -- |
| Miscellaneous information | 11.2. |
| Title | Experimental Background -- |
| Miscellaneous information | 11.2.1. |
| Title | Atomic Force Microscopy -- |
| Miscellaneous information | 11.2.1.1. |
| Title | Contact Mode -- |
| Miscellaneous information | 11.2.1.2. |
| Title | Noncontact Mode -- |
| Miscellaneous information | 11.2.2. |
| Title | Conductive Atomic Force Microscopy -- |
| Miscellaneous information | 11.2.3. |
| Title | Scanning Capacitance Microscopy -- |
| Miscellaneous information | 11.2.4. |
| Title | Kelvin Probe Force Microscopy -- |
| Miscellaneous information | 11.2.5. |
| Title | Scanning Tunneling Microscopy -- |
| Miscellaneous information | 11.2.6. |
| Title | Issues of Sample Preparation -- |
| Miscellaneous information | 11.3. |
| Title | Selected Applications -- |
| Miscellaneous information | 11.3.1. |
| Title | Surface Homogeneity -- |
| Miscellaneous information | 11.3.2. |
| Title | Grain Boundaries -- |
| Miscellaneous information | 11.3.3. |
| Title | Cross-Sectional Studies -- |
| Miscellaneous information | 11.4. |
| Title | Summary -- |
| -- | References -- |
| Miscellaneous information | 12. |
| Title | Electron Microscopy on Thin Films for Solar Cells / |
| Statement of responsibility | Sebastian S. Schmidt -- |
| Miscellaneous information | 12.1. |
| Title | Introduction -- |
| Miscellaneous information | 12.2. |
| Title | Scanning Electron Microscopy -- |
| Miscellaneous information | 12.2.1. |
| Title | Imaging Techniques -- |
| Miscellaneous information | 12.2.2. |
| Title | Electron Backscatter Diffraction -- |
| Miscellaneous information | 12.2.3. |
| Title | Energy-Dispersive and Wavelength-Dispersive X-Ray Spectrometry -- |
| Miscellaneous information | 12.2.4. |
| Title | Electron-Beam-Induced Current Measurements -- |
| Miscellaneous information | 12.2.4.1. |
| Title | Electron-Beam Generation -- |
| Miscellaneous information | 12.2.4.2. |
| Title | Charge-Carrier Collection in a Solar Cell. |
| Miscellaneous information | 12.2.4.3. |
| Title | Experimental Setups -- |
| Miscellaneous information | 12.2.4.4. |
| Title | Critical Issues -- |
| Miscellaneous information | 12.2.5. |
| Title | Cathodoluminescence -- |
| Miscellaneous information | 12.2.5.1. |
| Title | Example: Spectrum Imaging of CdTe Thin Films -- |
| Miscellaneous information | 12.2.6. |
| Title | Scanning Probe and Scanning-Probe Microscopy Integrated Platform -- |
| Miscellaneous information | 12.2.7. |
| Title | Combination of Various Scanning Electron Microscopy Techniques -- |
| Miscellaneous information | 12.3. |
| Title | Transmission Electron Microscopy -- |
| Miscellaneous information | 12.3.1. |
| Title | Imaging Techniques -- |
| Miscellaneous information | 12.3.1.1. |
| Title | Bright-Field and Dark-Field Imaging in the Conventional Mode -- |
| Miscellaneous information | 12.3.1.2. |
| Title | High-Resolution Imaging in the Conventional Mode -- |
| Miscellaneous information | 12.3.1.3. |
| Title | Imaging in the Scanning Mode Using an Annular Dark-Field Detector -- |
| Miscellaneous information | 12.3.2. |
| Title | Electron Diffraction. |
| Miscellaneous information | Note continued: |
| -- | 12.3.2.1. |
| Title | Selected-Area Electron Diffraction in the Conventional Mode -- |
| Miscellaneous information | 12.3.2.2. |
| Title | Convergent-Beam Electron Diffraction in the Scanning Mode -- |
| Miscellaneous information | 12.3.3. |
| Title | Electron Energy-Loss Spectrometry and Energy-Filtered Transmission Electron Microscopy -- |
| Miscellaneous information | 12.3.3.1. |
| Title | Scattering Theory -- |
| Miscellaneous information | 12.3.3.2. |
| Title | Experiment and Setup -- |
| Miscellaneous information | 12.3.3.3. |
| Title | The Energy-Loss Spectrum -- |
| Miscellaneous information | 12.3.3.4. |
| Title | Applications and Comparison with EDX Spectroscopy -- |
| Miscellaneous information | 12.3.4. |
| Title | Off-Axis and In-Line Electron Holography -- |
| Miscellaneous information | 12.4. |
| Title | Sample Preparation Techniques -- |
| Miscellaneous information | 12.4.1. |
| Title | Preparation for Scanning Electron Microscopy -- |
| Miscellaneous information | 12.4.2. |
| Title | Preparation for Transmission Electron Microscopy -- |
| -- | References -- |
| Miscellaneous information | 13. |
| Title | X-Ray and Neutron Diffraction on Materials for Thin-Film Solar Cells / |
| Statement of responsibility | Roland Mainz -- |
| Miscellaneous information | 13.1. |
| Title | Introduction -- |
| Miscellaneous information | 13.2. |
| Title | Diffraction of X-Rays and Neutron by Matter -- |
| Miscellaneous information | 13.3. |
| Title | Neutron Powder Diffraction of Absorber Materials for Thin-Film Solar Cells -- |
| Miscellaneous information | 13.3.1. |
| Title | Example: Investigation of Intrinsic Point Defects in Nonstoichiometric CuInSe2 by Neutron Diffraction. |
| Miscellaneous information | 13.4. |
| Title | Grazing Incidence X-Ray Diffraction (GIXRD) -- |
| Miscellaneous information | 13.5. |
| Title | Energy Dispersive X-Ray Diffraction (EDXRD) -- |
| -- | References -- |
| Miscellaneous information | 14. |
| Title | Raman Spectroscopy on Thin Films for Solar Cells / |
| Statement of responsibility | Alejandro Perez-Rodriguez -- |
| Miscellaneous information | 14.1. |
| Title | Introduction -- |
| Miscellaneous information | 14.2. |
| Title | Fundamentals of Raman Spectroscopy -- |
| Miscellaneous information | 14.3. |
| Title | Vibrational Modes in Crystalline Materials -- |
| Miscellaneous information | 14.4. |
| Title | Experimental Considerations -- |
| Miscellaneous information | 14.4.1. |
| Title | Laser Source -- |
| Miscellaneous information | 14.4.2. |
| Title | Light Collection and Focusing Optics -- |
| Miscellaneous information | 14.4.3. |
| Title | Spectroscopic Module -- |
| Miscellaneous information | 14.5. |
| Title | Characterization of Thin-Film Photovoltaic Materials -- |
| Miscellaneous information | 14.5.1. |
| Title | Identification of Crystalline Structures -- |
| Miscellaneous information | 14.5.2. |
| Title | Evaluation of Film Crystallinity -- |
| Miscellaneous information | 14.5.3. |
| Title | Chemical Analysis of Semiconducting Alloys -- |
| Miscellaneous information | 14.5.4. |
| Title | Nanocrystalline and Amorphous Materials -- |
| Miscellaneous information | 14.5.5. |
| Title | Evaluation of Stress -- |
| Miscellaneous information | 14.6. |
| Title | Conclusions -- |
| -- | References -- |
| Miscellaneous information | 15. |
| Title | Soft X-Ray and Electron Spectroscopy: A Unique "Tool Chest" to Characterize the Chemical and Electronic Properties of Surfaces and Interfaces / |
| Statement of responsibility | Clemens Heske -- |
| Miscellaneous information | 15.1. |
| Title | Introduction -- |
| Miscellaneous information | 15.2. |
| Title | Characterization Techniques -- |
| Miscellaneous information | 15.3. |
| Title | Probing the Chemical Surface Structure: Impact of Wet Chemical Treatments on Thin-Film Solar Cell Absorbers. |
| Miscellaneous information | 15.4. |
| Title | Probing the Electronic Surface and Interface Structure: Band Alignment in Thin-Film Solar Cells -- |
| Miscellaneous information | 15.5. |
| Title | Summary -- |
| -- | References -- |
| Miscellaneous information | 16. |
| Title | Elemental Distribution Profiling of Thin Films for Solar Cells / |
| Statement of responsibility | Raquel Caballero -- |
| Miscellaneous information | 16.1. |
| Title | Introduction -- |
| Miscellaneous information | 16.2. |
| Title | Glow Discharge-Optical Emission (GD-OES) and Glow Discharge-Mass Spectroscopy (GD-MS) -- |
| Miscellaneous information | 16.2.1. |
| Title | Principles -- |
| Miscellaneous information | 16.2.2. |
| Title | Instrumentation -- |
| Miscellaneous information | 16.2.2.1. |
| Title | Plasma Sources -- |
| Miscellaneous information | 16.2.2.2. |
| Title | Plasma Conditions -- |
| Miscellaneous information | 16.2.2.3. |
| Title | Detection of Optical Emission -- |
| Miscellaneous information | 16.2.2.4. |
| Title | Mass Spectroscopy -- |
| Miscellaneous information | 16.2.3. |
| Title | Quantification -- |
| Miscellaneous information | 16.2.3.1. |
| Title | Glow Discharge-Optical Emission Spectroscopy -- |
| Miscellaneous information | 16.2.3.2. |
| Title | Glow Discharge-Mass Spectroscopy -- |
| Miscellaneous information | 16.2.4. |
| Title | Applications -- |
| Miscellaneous information | 16.2.4.1. |
| Title | Glow Discharge-Optical Emission Spectroscopy -- |
| Miscellaneous information | 16.2.4.2. |
| Title | Glow Discharge-Mass Spectroscopy -- |
| Miscellaneous information | 16.3. |
| Title | Secondary Ion Mass Spectrometry (SIMS) -- |
| Miscellaneous information | 16.3.1. |
| Title | Principle of the Method -- |
| Miscellaneous information | 16.3.2. |
| Title | Data Analysis -- |
| Miscellaneous information | 16.3.3. |
| Title | Quantification -- |
| Miscellaneous information | 16.3.4. |
| Title | Applications for Solar Cells -- |
| Miscellaneous information | 16.4. |
| Title | Auger Electron Spectroscopy (AES) -- |
| Miscellaneous information | 16.4.1. |
| Title | Introduction -- |
| Miscellaneous information | 16.4.2. |
| Title | The Auger Process -- |
| Miscellaneous information | 16.4.3. |
| Title | Auger Electron Signals. |
| Miscellaneous information | 16.4.4. |
| Title | Instrumentation -- |
| Miscellaneous information | 16.4.5. |
| Title | Auger Electron Signal Intensities and Quantification -- |
| Miscellaneous information | 16.4.6. |
| Title | Quantification -- |
| Miscellaneous information | 16.4.7. |
| Title | Application -- |
| Miscellaneous information | 16.5. |
| Title | X-Ray Photoelectron Spectroscopy (XPS) -- |
| Miscellaneous information | 16.5.1. |
| Title | Theoretical Principles -- |
| Miscellaneous information | 16.5.2. |
| Title | Instrumentation -- |
| Miscellaneous information | 16.5.3. |
| Title | Application to Thin Film Solar Cells -- |
| Miscellaneous information | 16.6. |
| Title | Energy-Dispersive X-Ray Analysis on Fractured Cross Sections -- |
| Miscellaneous information | 16.6.1. |
| Title | Basics on Energy-Dispersive X-Ray Spectrometry in a Scanning Electron Microscope -- |
| Miscellaneous information | 16.6.2. |
| Title | Spatial Resolutions -- |
| Miscellaneous information | 16.6.3. |
| Title | Applications -- |
| Miscellaneous information | 16.6.3.1. |
| Title | Sample Preparation -- |
| -- | References -- |
| Miscellaneous information | 17. |
| Title | Hydrogen Effusion Experiments / |
| Statement of responsibility | Florian Einsele -- |
| Miscellaneous information | 17.1. |
| Title | Introduction -- |
| Miscellaneous information | 17.2. |
| Title | Experimental Setup -- |
| Miscellaneous information | 17.3. |
| Title | Data Analysis -- |
| Miscellaneous information | 17.3.1. |
| Title | Identification of Rate-Limiting Process -- |
| Miscellaneous information | 17.3.2. |
| Title | Analysis of Diffusing Hydrogen Species from Hydrogen Effusion Measurements -- |
| Miscellaneous information | 17.3.3. |
| Title | Analysis of H2 Surface Desorption -- |
| Miscellaneous information | 17.3.4. |
| Title | Analysis of Diffusion-Limited Effusion -- |
| Miscellaneous information | 17.3.5. |
| Title | Analysis of Effusion Spectra in Terms of Hydrogen Density of States -- |
| Miscellaneous information | 17.3.6. |
| Title | Analysis of Film Microstructure by Effusion of Implanted Rare Gases. |
| Miscellaneous information | 17.4. |
| Title | Discussion of Selected Results -- |
| Miscellaneous information | 17.4.1. |
| Title | Amorphous Silicon and Germanium Films -- |
| Miscellaneous information | 17.4.1.1. |
| Title | Material Density versus Annealing and Hydrogen Content -- |
| Miscellaneous information | 17.4.1.2. |
| Title | Effect of Doping on H Effusion -- |
| Miscellaneous information | 17.4.2. |
| Title | Amorphous Silicon Alloys: Si-C -- |
| Miscellaneous information | 17.4.3. |
| Title | Microcrystalline Silicon -- |
| Miscellaneous information | 17.4.4. |
| Title | Zinc Oxide Films -- |
| Miscellaneous information | 17.5. |
| Title | Comparison with Other Experiments -- |
| Miscellaneous information | 17.6. |
| Title | Concluding Remarks -- |
| -- | References -- |
| Miscellaneous information | pt. Four |
| Title | Materials and Device Modeling -- |
| Miscellaneous information | 18. |
| Title | Ab-Initio Modeling of Defects in Semiconductors / |
| Statement of responsibility | Johan Pohl -- |
| Miscellaneous information | 18.1. |
| Title | Introduction -- |
| Miscellaneous information | 18.2. |
| Title | Density Functional Theory and Methods -- |
| Miscellaneous information | 18.2.1. |
| Title | Basis Sets -- |
| Miscellaneous information | 18.2.2. |
| Title | Functionals for Exchange and Correlation -- |
| Miscellaneous information | 18.2.2.1. |
| Title | Local Approximations -- |
| Miscellaneous information | 18.2.2.2. |
| Title | Functionals Beyond LDA/GGA -- |
| Miscellaneous information | 18.3. |
| Title | Methods Beyond DFT -- |
| Miscellaneous information | 18.4. |
| Title | From Total Energies to Materials' Properties -- |
| Miscellaneous information | 18.5. |
| Title | Ab-initio Characterization of Point Defects -- |
| Miscellaneous information | 18.5.1. |
| Title | Thermodynamics of Point Defects -- |
| Miscellaneous information | 18.5.2. |
| Title | Formation Energies from Ab-Initio Calculations -- |
| Miscellaneous information | 18.5.3. |
| Title | Case study Point Defects in ZnO -- |
| Miscellaneous information | 18.6. |
| Title | Conclusions -- |
| -- | References -- |
| Miscellaneous information | 19. |
| Title | One-Dimensional Electro-Optical Simulations of Thin-Film Solar Cells / |
| Statement of responsibility | Thomas Kirchartz. |
| Miscellaneous information | 19.1. |
| Title | Introduction -- |
| Miscellaneous information | 19.2. |
| Title | Fundamentals -- |
| Miscellaneous information | 19.3. |
| Title | Modeling Hydrogenated Amorphous and Microcrystalline Silicon -- |
| Miscellaneous information | 19.3.1. |
| Title | Density of States and Transport Hydrogenated Amorphous Silicon -- |
| Miscellaneous information | 19.3.2. |
| Title | Density of States and Transport Hydrogenated Microcrystalline Silicon -- |
| Miscellaneous information | 19.3.3. |
| Title | Modeling Recombination in a-Si: H and & mu;c-Si: H -- |
| Miscellaneous information | 19.3.3.1. |
| Title | Recombination Statistics for Single-Electron States: Shockley-Read-Hall Recombination -- |
| Miscellaneous information | 19.3.3.2. |
| Title | Recombination Statistics for Amphoteric States -- |
| Miscellaneous information | 19.3.4. |
| Title | Modeling Cu(In, Ga)Se2 Solar Cells -- |
| Miscellaneous information | 19.3.4.1. |
| Title | Graded Band-Gap Devices -- |
| Miscellaneous information | 19.3.4.2. |
| Title | Issues when Modeling Graded Band-Gap Devices -- |
| Miscellaneous information | 19.3.4.3. |
| Title | Example -- |
| Miscellaneous information | 19.3.5. |
| Title | Modeling of CdTe Solar Cells -- |
| Miscellaneous information | 19.3.5.1. |
| Title | Baseline -- |
| Miscellaneous information | 19.3.5.2. |
| Title | The & Phi;b -- NAc (Barrier-Doping) Trade-Off -- |
| Miscellaneous information | 19.3.5.3. |
| Title | C-V Analysis as an Interpretation Aid of I-V Curves -- |
| Miscellaneous information | 19.4. |
| Title | Optical Modeling of Thin Solar Cells -- |
| Miscellaneous information | 19.4.1. |
| Title | Coherent Modeling of Flat Interfaces -- |
| Miscellaneous information | 19.4.2. |
| Title | Modeling of Rough Interfaces -- |
| Miscellaneous information | 19.5. |
| Title | Tools -- |
| Miscellaneous information | 19.5.1. |
| Title | AFORS-HET -- |
| Miscellaneous information | 19.5.2. |
| Title | AMPS-1D -- |
| Miscellaneous information | 19.5.3. |
| Title | ASA -- |
| Miscellaneous information | 19.5.4. |
| Title | PC1D -- |
| Miscellaneous information | 19.5.5. |
| Title | SCAPS. |
| Miscellaneous information | 19.5.6. |
| Title | SC-SIMUL -- |
| -- | References -- |
| Miscellaneous information | 20. |
| Title | Two- and Three-Dimensional Electronic Modeling of Thin-Film Solar Cells / |
| Statement of responsibility | Wyatt K. Metzger -- |
| Miscellaneous information | 20.1. |
| Title | Introduction -- |
| Miscellaneous information | 20.2. |
| Title | Applications -- |
| Miscellaneous information | 20.3. |
| Title | Methods -- |
| Miscellaneous information | 20.3.1. |
| Title | Equivalent-Circuit Modeling -- |
| Miscellaneous information | 20.3.2. |
| Title | Solving Semiconductor Equations -- |
| Miscellaneous information | 20.4.2.1. |
| Title | Creating a Semiconductor Model -- |
| Miscellaneous information | 20.4. |
| Title | Examples -- |
| Miscellaneous information | 20.4.1. |
| Title | Equivalent-Circuit Modeling Examples -- |
| Miscellaneous information | 20.4.2. |
| Title | Semiconductor Modeling Examples -- |
| Miscellaneous information | 20.5. |
| Title | Summary -- |
| -- | References. |
| 588 0# - SOURCE OF DESCRIPTION NOTE | |
| Source of description note | Print version record. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Photovoltaic cells |
| General subdivision | Materials |
| -- | Research. |
| Topical term or geographic name as entry element | TECHNOLOGY & ENGINEERING |
| General subdivision | Mechanical. |
| Source of heading or term | bisacsh |
| 655 #4 - INDEX TERM--GENRE/FORM | |
| Genre/form data or focus term | Electronic books. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Rau, U. |
| Fuller form of name | (Uwe) |
| Relator code | edt |
| Personal name | Abou-Ras, Daniel. |
| Relator code | edt |
| Personal name | Kirchartz, Thomas. |
| Relator code | edt |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
| Relationship information | Print version: |
| Title | Advanced characterization techniques for thin film solar cells. |
| Place, publisher, and date of publication | Weinheim, Germany : Wiley-VCH, ©2011 |
| International Standard Book Number | 3527410031 |
| Record control number | (OCoLC)676728907 |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | <a href="http://onlinelibrary.wiley.com/book/10.1002/9783527636280">http://onlinelibrary.wiley.com/book/10.1002/9783527636280</a> |
| Public note | Wiley Online Library [Free Download only for SUST IP] |
| 938 ## - | |
| -- | EBL - Ebook Library |
| -- | EBLB |
| -- | EBL4042249 |
| -- | Books 24x7 |
| -- | B247 |
| -- | bke00044295 |
| -- | Coutts Information Services |
| -- | COUT |
| -- | 19349331 |
| -- | EBL - Ebook Library |
| -- | EBLB |
| -- | EBL700957 |
| -- | ebrary |
| -- | EBRY |
| -- | ebr10501310 |
| -- | EBSCOhost |
| -- | EBSC |
| -- | 398564 |
| -- | YBP Library Services |
| -- | YANK |
| -- | 7191908 |
| -- | YBP Library Services |
| -- | YANK |
| -- | 5488786 |
| -- | YBP Library Services |
| -- | YANK |
| -- | 12679357 |
| 994 ## - | |
| -- | 92 |
| -- | DG1 |
No items available.