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Beam Diagnostics in Superconducting Accelerating Cavities [electronic resource] : The Extraction of Transverse Beam Position from Beam-Excited Higher Order Modes / by Pei Zhang.

By: Contributor(s): Material type: TextTextSeries: Springer Theses, Recognizing Outstanding Ph.D. ResearchPublisher: Cham : Springer International Publishing : Imprint: Springer, 2013Description: XII, 118 p. 180 illus., 40 illus. in color. online resourceContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9783319007595
Subject(s): Additional physical formats: Printed edition:: No titleDDC classification:
  • 539.73 23
LOC classification:
  • QC770-798
Online resources:
Contents:
Electromagnetic Eigenmode Simulations of the Third Harmonic Cavity -- Measurements of HOM Spectra -- Analysis Methods for Beam Position Extraction from HOM -- Dependencies of HOM on Transverse Beam Offsets -- HOM-Based Beam Position Diagnostics.
In: Springer eBooksSummary: This work employs self-excited wakefields as a diagnostic to remotely determine the beam position within a superconducting cavity and chains thereof. Several numerical techniques are delineated in order to ascertain the most appropriate technique in terms of reliability and accuracy. The methodology is carefully explained making the presentation pedagogically appropriate to students new to the field as well as researchers familiar with this topic. Pei Zhang's achievements will serve as a basis for the development of similar monitors at various other facilities around the world.
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Electromagnetic Eigenmode Simulations of the Third Harmonic Cavity -- Measurements of HOM Spectra -- Analysis Methods for Beam Position Extraction from HOM -- Dependencies of HOM on Transverse Beam Offsets -- HOM-Based Beam Position Diagnostics.

This work employs self-excited wakefields as a diagnostic to remotely determine the beam position within a superconducting cavity and chains thereof. Several numerical techniques are delineated in order to ascertain the most appropriate technique in terms of reliability and accuracy. The methodology is carefully explained making the presentation pedagogically appropriate to students new to the field as well as researchers familiar with this topic. Pei Zhang's achievements will serve as a basis for the development of similar monitors at various other facilities around the world.

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