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Semiconductor material and device characterization / Dieter K. Schroder.
Material type:
TextPublication details: [Piscataway, NJ] : IEEE Press ; Hoboken, N.J. : Wiley, c2006.Edition: 3rd edDescription: xv, 779 p. : ill. ; 25 cmISBN: - 0471739065 (acidfree paper)
- 9780471739067
- 621.38152 22 SCS
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode |
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Library, Institute of Information and Communication Technology General Stacks | 621.38152 SCS (Browse shelf(Opens below)) | 1 | Available | I000867 | |
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Library, Institute of Information and Communication Technology General Stacks | 621.38152 SCS (Browse shelf(Opens below)) | 2 | Available | I000866 |
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| 621.38152 RAP Power electronics circuits, devices, and applications / | 621.38152 SCS Semiconductor material and device characterization / | 621.38152 SCS Semiconductor material and device characterization / | 621.38152 SCS Semiconductor material and device characterization / | 621.38152 SCS Semiconductor material and device characterization / | 621.38152 SEM Semiconductor materials and devices / | 621.38152 SEM Semiconductor materials and devices / |
"Wiley-Interscience."
Includes bibliographical references and index.
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