Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach / edited by Yichuang Sun.
Material type: TextSeries: IET circuits, devices and systems series ; 19.Publication details: London : Institution of Engineering and Technology, c2008.Description: xx, 389 pages : illustrations ; 24 cmISBN:- 9780863417450 (pbk.)
- 0863417450 (pbk.)
- 621.38150287 22 TES
Item type | Current library | Call number | Copy number | Status | Date due | Barcode |
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Books | Library, Institute of Information and Communication Technology General Stacks | 621.38150287 TES (Browse shelf(Opens below)) | 1 | Available | I000124 | |
Books | Library, Institute of Information and Communication Technology General Stacks | 621.38150287 TES (Browse shelf(Opens below)) | 2 | Available | I000125 |
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621.3815 ZIE Electronic circuit theory: | 621.38150285 COM Computer-aided design of analog integrated circuits and systems / | 621.38150285 COM Computer-aided design of analog integrated circuits and systems / | 621.38150287 TES Test and diagnosis of analogue, mixed-signal and RF integrated circuits : | 621.38150287 TES Test and diagnosis of analogue, mixed-signal and RF integrated circuits : | 621.38150294 ANA Analysis and design of analog integrated circuits / | 621.38150294 ANA Analysis and design of analog integrated circuits / |
Includes bibliographical references and index.
Fault diagnosis of linear and non-linear analogue circuits / Yichuang Sun -- Symbolic function approaches for analogue fault diagnosis / Stefano Manetti and Maria Cristina Piccirilli -- Neural-network-based approaches for analogue circuit fault diagnosis / Yichuang Sun and Yigang He -- Hierarchical/decomposition techniques for large-scale analogue diagnosis / Peter Shepherd -- DFT and BIST techniques for analogue and mixed-signal test / Mona Safi-Harb and Gordon Roberts -- Design-for-testability of analogue filters / Yichuang Sun and Masood-ul Hasan -- Test of A/D converters: from converter characteristics to built-in self-test proposals / Andreas Lechner and Andrew Richardson -- Test of [Sigma Delta] converters / Gildas Leger and Adoracion Rueda -- Phase-locked loop test methodologies: current characterization and production test practices / Martin John Burbidge and Andrew Richardson -- On-chip testing techniques for RF wirless transceiver systems and components / Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar Sanchez-Sinencio -- Tuning and calibration of analogue, mixed-signal and RF circuits / James Moritz and Yichuang Sun.
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