Semiconductor material and device characterization / Dieter K. Schroder.
Material type: TextPublication details: New York : Wiley, c1998.Edition: 2nd edDescription: xxiv, 760 p. : ill. ; 25 cmISBN:- 0471241393 (cloth : alk. paper)
- 621.38152 22
Item type | Current library | Call number | Copy number | Status | Date due | Barcode |
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Books | Central Library, SUST General Stacks | 621.38152 SCS (Browse shelf(Opens below)) | 1 | Available | 0042789 | |
Books | Central Library, SUST General Stacks | 621.38152 SCS (Browse shelf(Opens below)) | 2 | Available | 0042788 |
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621.38152 PIS Semiconductor devices fundamentals / | 621.38152 PRE Experiments in CMOS technology / | 621.38152 RAP Power electronics circuits, devices, and applications / | 621.38152 SCS Semiconductor material and device characterization / | 621.38152 SCS Semiconductor material and device characterization / | 621.38152 SCS Semiconductor material and device characterization / | 621.38152 SCS Semiconductor material and device characterization / |
"A Wiley-Interscience publication."
Includes bibliographical references and index.
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