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Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach / edited by Yichuang Sun.

Contributor(s): Material type: TextTextSeries: IET circuits, devices and systems series ; 19.Publication details: London : Institution of Engineering and Technology, c2008.Description: xx, 389 pages : illustrations ; 24 cmISBN:
  • 9780863417450 (pbk.)
  • 0863417450 (pbk.)
Subject(s): DDC classification:
  • 621.38150287 22 TES
Online resources:
Contents:
Fault diagnosis of linear and non-linear analogue circuits / Yichuang Sun -- Symbolic function approaches for analogue fault diagnosis / Stefano Manetti and Maria Cristina Piccirilli -- Neural-network-based approaches for analogue circuit fault diagnosis / Yichuang Sun and Yigang He -- Hierarchical/decomposition techniques for large-scale analogue diagnosis / Peter Shepherd -- DFT and BIST techniques for analogue and mixed-signal test / Mona Safi-Harb and Gordon Roberts -- Design-for-testability of analogue filters / Yichuang Sun and Masood-ul Hasan -- Test of A/D converters: from converter characteristics to built-in self-test proposals / Andreas Lechner and Andrew Richardson -- Test of [Sigma Delta] converters / Gildas Leger and Adoracion Rueda -- Phase-locked loop test methodologies: current characterization and production test practices / Martin John Burbidge and Andrew Richardson -- On-chip testing techniques for RF wirless transceiver systems and components / Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar Sanchez-Sinencio -- Tuning and calibration of analogue, mixed-signal and RF circuits / James Moritz and Yichuang Sun.
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Holdings
Item type Current library Call number Copy number Status Date due Barcode
Books Books Library, Institute of Information and Communication Technology General Stacks 621.38150287 TES (Browse shelf(Opens below)) 1 Available I000124
Books Books Library, Institute of Information and Communication Technology General Stacks 621.38150287 TES (Browse shelf(Opens below)) 2 Available I000125

Includes bibliographical references and index.

Fault diagnosis of linear and non-linear analogue circuits / Yichuang Sun -- Symbolic function approaches for analogue fault diagnosis / Stefano Manetti and Maria Cristina Piccirilli -- Neural-network-based approaches for analogue circuit fault diagnosis / Yichuang Sun and Yigang He -- Hierarchical/decomposition techniques for large-scale analogue diagnosis / Peter Shepherd -- DFT and BIST techniques for analogue and mixed-signal test / Mona Safi-Harb and Gordon Roberts -- Design-for-testability of analogue filters / Yichuang Sun and Masood-ul Hasan -- Test of A/D converters: from converter characteristics to built-in self-test proposals / Andreas Lechner and Andrew Richardson -- Test of [Sigma Delta] converters / Gildas Leger and Adoracion Rueda -- Phase-locked loop test methodologies: current characterization and production test practices / Martin John Burbidge and Andrew Richardson -- On-chip testing techniques for RF wirless transceiver systems and components / Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar Sanchez-Sinencio -- Tuning and calibration of analogue, mixed-signal and RF circuits / James Moritz and Yichuang Sun.

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