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VLSI Design and Test [electronic resource] : 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers / edited by Manoj Singh Gaur, Mark Zwolinski, Vijay Laxmi, Dharmendra Boolchandani, Virendra Sing, Adit D. Sing.

Contributor(s): Material type: TextTextSeries: Communications in Computer and Information Science ; 382Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013Description: XVI, 388 p. 246 illus. online resourceContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9783642420245
Subject(s): Additional physical formats: Printed edition:: No titleDDC classification:
  • 004 23
LOC classification:
  • QA75.5-76.95
  • TK7885-7895
Online resources:
Contents:
VLSI design -- Testing and verification -- Embedded systems -- Emerging technology.
In: Springer eBooksSummary: This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
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VLSI design -- Testing and verification -- Embedded systems -- Emerging technology.

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

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